1995
DOI: 10.1149/1.2221293
|View full text |Cite
|
Sign up to set email alerts
|

Oxidation Behavior of CVD and Single Crystal SiC at 1100°C

Abstract: High purity chemical vapor deposition (CVD) silicon carbide fabricated by a commercial process was examined and oxidized at 1100~ along with high purity single crystal silicon carbide. The freestanding CVD thick films had a highly textured polycrystalline microstructure, with the <111 > directions of the crys_tals_parallel to the growth direction. This texturing maintained the polarity_of the 43m crystal structure, implying that either the [111 ] or the [1 ! 1] direction grew significantly faster during the C… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
2
0

Year Published

1996
1996
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 12 publications
(3 citation statements)
references
References 2 publications
0
2
0
Order By: Relevance
“…Since the oxidation rate has been shown to depend only weakly on the polytype for the Si-face and not at all for the C-face [17], we find it reasonable to assume that although there may be small quantitative differences between the oxidation processes of different polytypes along the perpendicular directions to the bilayer stacking units, the main processes-diffusion, interface reaction rates and so on, should be largely comparable, and so it is reasonable to discuss oxidations mechanisms without paying special attention to the polytype. Nevertheless some early oxidation experiments were performed before the wide availability of good quality substrates, for example, using hotpressed powders [18] or textured polycrystalline layers [19]. We therefore restrict our attention here to experiments in which the oxidation conditions and the nature and orientation of the single crystalline substrate are clearly defined.…”
Section: Oxidation Kineticsmentioning
confidence: 99%
“…Since the oxidation rate has been shown to depend only weakly on the polytype for the Si-face and not at all for the C-face [17], we find it reasonable to assume that although there may be small quantitative differences between the oxidation processes of different polytypes along the perpendicular directions to the bilayer stacking units, the main processes-diffusion, interface reaction rates and so on, should be largely comparable, and so it is reasonable to discuss oxidations mechanisms without paying special attention to the polytype. Nevertheless some early oxidation experiments were performed before the wide availability of good quality substrates, for example, using hotpressed powders [18] or textured polycrystalline layers [19]. We therefore restrict our attention here to experiments in which the oxidation conditions and the nature and orientation of the single crystalline substrate are clearly defined.…”
Section: Oxidation Kineticsmentioning
confidence: 99%
“…Fig. 5 summarizes the kp values in O 2 atmospheres for pure materials of CVD and single crystal SiC bodies [13][14][15][16][17][18][19]. It is generally understood that the activation energy can be a relatively small value around 100 kJ/mol below 1600 K implying the oxygen permeation limited process [6].…”
Section: High-temperature Oxidation and Corrosion 2005mentioning
confidence: 99%
“…The oxidation behavior of SiC has been studied in a wide temperature range and at various atmospheres. 1, In particular, several studies have been devoted to understand the oxidation kinetics in sintered SiC, [6][7][8][9] highly pure chemical vapor deposited (CVD) SiC, [10][11][12][13][14][15][16][17][18][19][20][21][22][23] and single crystalline SiC. 7,8,[25][26][27] Among them, sintered SiC usually contains additives such as boron, carbon, and aluminum, which tend to degrade its oxidation resistance at high temperatures.…”
Section: Introductionmentioning
confidence: 99%