2013
DOI: 10.4028/www.scientific.net/ssp.205-206.103
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Overview and Latest Developments in Photoconductance Lifetime Measurements in Silicon

Abstract: Photoconductance measurements have been one of the most common ways to measure the lifetime in silicon for over 60 years. Since 1985, the most common method for doing calibrated lifetime measurements is using an eddy-current sensor to monitor photoconductance as a function of time and illumination, providing data that can be interpreted in terms of carrier density and hence lifetime. Here we present recent extensions to this measurement technique that have generalized the method. Bulk lifetime measurements on … Show more

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Cited by 4 publications
(2 citation statements)
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References 9 publications
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“…A variety of treatments were tested, as described below, but where not specified, the wafers were etched in 25% TMAH for 10 minutes. Taking the required safety precautions appropriate to HF, the prepared wafers were placed into a large plastic petri-dish containing 60 mL of HF and centered over an inductive coil for PC measurements (using the WCT-120 lifetime tester 16 ). To achieve very low S, the wafers were illuminated at 0.2 suns for 1 minute using a halogen lamp, the illumination was switched off, and a PC measurement was taken using a Quantum Qflash X2 lamp with an 870 nm long pass filter for optical generation.…”
Section: Methodsmentioning
confidence: 99%
“…A variety of treatments were tested, as described below, but where not specified, the wafers were etched in 25% TMAH for 10 minutes. Taking the required safety precautions appropriate to HF, the prepared wafers were placed into a large plastic petri-dish containing 60 mL of HF and centered over an inductive coil for PC measurements (using the WCT-120 lifetime tester 16 ). To achieve very low S, the wafers were illuminated at 0.2 suns for 1 minute using a halogen lamp, the illumination was switched off, and a PC measurement was taken using a Quantum Qflash X2 lamp with an 870 nm long pass filter for optical generation.…”
Section: Methodsmentioning
confidence: 99%
“…More details on this technique can be found in [Martin, 2004], [Ferré, 2008]. The instrument used in this thesis to measure the effective lifetime τ eff as a function of the injection level ∆n was the WCT-100 provided by Sinton Consulting [Sinton, 1999].…”
Section: C) Characterization Of the Recombination Mechanismsmentioning
confidence: 99%