2016
DOI: 10.1063/1.4948511
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Overshoot effects of electron on efficiency droop in InGaN/GaN MQW light-emitting diodes

Abstract: To evaluate electron leakage in InGaN/GaN multiple quantum well (MQW) light emitting diodes (LEDs), analytic models of ballistic and quasi-ballistic transport are developed. With this model, the impact of critical variables effecting electron leakage, including the electron blocking layer (EBL), structure of multiple quantum wells (MQWs), polarization field, and temperature are explored. The simulated results based on this model shed light on previously reported experimental observations and provide basic crit… Show more

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Cited by 5 publications
(5 citation statements)
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“…In doing so, this approach ensures that the carriers populate the wells and that transmission properties can be studied efficiently, without having to include numerically expensive electron-phonon coupling effects, which can be addressed in future studies. We note that similar approaches have been used in the literature to study the ballistic transport properties in InGaN MQWs, however, without considering the impact of alloy fluctuations and thus connected carrier localization effects [26][27][28].…”
Section: Theoretical Frameworkmentioning
confidence: 99%
“…In doing so, this approach ensures that the carriers populate the wells and that transmission properties can be studied efficiently, without having to include numerically expensive electron-phonon coupling effects, which can be addressed in future studies. We note that similar approaches have been used in the literature to study the ballistic transport properties in InGaN MQWs, however, without considering the impact of alloy fluctuations and thus connected carrier localization effects [26][27][28].…”
Section: Theoretical Frameworkmentioning
confidence: 99%
“…This is also useful to improve the holes injection efficiency. At the same time, In 0.03 GaN/GaN superlattice between n-GaN and MQWs can help to improve the surface roughness and reduce the density of the V-defects, which is normally found in InGaN/GaN MQWs [20][21][22] . What is more, about the 230 meV energy barrier as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The carriers trapped in the QWs can either recombine with the rate of f rec or escape the QWs, causing carrier leakage out of the active region at a rate of f leak . The leakage is caused by the thermionic emission, carrier overflow, and other mechanisms [45].…”
Section: Dynamic Photon Generation Modelsmentioning
confidence: 99%