2018
DOI: 10.1038/s41598-018-32746-y
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Overcoming Carrier Concentration Limits in Polycrystalline CdTe Thin Films with In Situ Doping

Abstract: Thin film materials for photovoltaics such as cadmium telluride (CdTe), copper-indium diselenide-based chalcopyrites (CIGS), and lead iodide-based perovskites offer the potential of lower solar module capital costs and improved performance to microcrystalline silicon. However, for decades understanding and controlling hole and electron concentration in these polycrystalline films has been extremely challenging and limiting. Ionic bonding between constituent atoms often leads to tenacious intrinsic compensating… Show more

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Cited by 91 publications
(27 citation statements)
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“…Hence, levels of an impurity, defects, and carrier concentrations affect the mobility of carriers in a semiconductor. Mobility decreases for batch D and E, and for C samples, the highest carrier concentration is achieved indicating effective treatment to be around 390-405 • C. CdTe has the drawback that it is difficult to achieve high doping concentration due to self-compensation from intrinsic defects form, e.g., vacancies (V Cd , V Te ), interstitial defects (Cd i , Te i ), and grain boundaries [58]. Therefore, CdTe carrier concentration is found low, which is one of the key challenges to improve CdTe solar cells' energy yield performance.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…Hence, levels of an impurity, defects, and carrier concentrations affect the mobility of carriers in a semiconductor. Mobility decreases for batch D and E, and for C samples, the highest carrier concentration is achieved indicating effective treatment to be around 390-405 • C. CdTe has the drawback that it is difficult to achieve high doping concentration due to self-compensation from intrinsic defects form, e.g., vacancies (V Cd , V Te ), interstitial defects (Cd i , Te i ), and grain boundaries [58]. Therefore, CdTe carrier concentration is found low, which is one of the key challenges to improve CdTe solar cells' energy yield performance.…”
Section: Electrical Propertiesmentioning
confidence: 99%
“…Это понижает степень компенсации акцепторов в слоях и увеличивает концентрацию дырок. Более сложное изменение электрофизических параметров при отжиге образцов CdTe : As, полученных при ДИПТ/ДМК = 0.5, вероятно, объясняется наличием в слоях существенной концентрации межузельного кадмия Cd, который самостоятельно образует глубокий донорный уровень с энергией ионизации 330 мэВ [20] и может взаимодействовать при более высоких температурах отжига с дефектами, связанными с мышьяком.…”
Section: результаты и их обсуждениеunclassified
“…Group V element (e.g., As and P) doping, as an alternative to Cu doping for the desired long-time stability, has recently attracted intensive investigations. [7][8][9] However, limited by the high capital costs of the equipment used for the in-situ doping and low effective doping level for the ex situ doping (due to aggregations at grain boundaries), group V doping has not been widely used by the researchers [7,10].…”
Section: Introductionmentioning
confidence: 99%