Oscillation-test strategy for analog and mixed-signal integrated circuits

Arabi, K.; Kaminska, Bożena

doi:10.1109/vtest.1996.510896

Cited by 134 publications

(74 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Unclassified

Order By: Relevance

“…In [9], an ordering scheme to reduce the test time of parametric faults is presented. In [3], an oscillation based test scheme is used to detect faults. In [18], parametric faults are formulated to estimate yield coverage.…”

Section: Previous Workmentioning

confidence: 99%

A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs

Topaloglu

Orailoğlu

2005

Proceedings of the 42nd Annual Conference on Design Automation - DAC '05

View full text Add to dashboard Cite

Abstract-A design for test (DFT) hardware is proposed to increase the controllability of a thermometer coded current steering digital to analog converter. A procedure is introduced to reduce the diagnosis and structural test time from quadratic to linear using the proposed DFT hardware. To evaluate the applicability of the proposed technique, principal component analysis is used to create virtual process variations to simulate in lieu of semiconductor fabrication data. An architecture specific soft fault model is suggested for the diagnosis problem. Random errors according to the fault model are introduced in the virtual test environment on top of the process variations and it is shown that diagnosis of a fault is possible with high accuracy with the proposed method. The same technique employing principal component analysis is furthermore used to provide process variation-aware reference test comparison values for a structural test of the DAC. The structural test provides a mechanism to test for even unmodeled manufacturing faults. The process variation-aware test values help detect defects even under process variations. The proposed DFT hardware and method are low cost and quite suitable for a built-in self diagnosis and test implementation.

show abstract

Section: Previous Workmentioning

confidence: 99%

A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs

Topaloglu

Orailoğlu

2005

Proceedings of the 42nd Annual Conference on Design Automation - DAC '05

View full text Add to dashboard Cite

show abstract

“…In order to overcome the problem of the limited accessibility in ICs, design for testability measures have to be taken to improve the controllability and observability by propagating test signals from the external IC pins to and from internal, otherwise inaccessible nodes [140]. These measures can for instance take the form of extra test pins or extra test structures [e.g., (de)multiplexers] to isolate and individually test the different analog blocks in the system [144], analog scan path techniques to read out selected test node signals into a serial scan path [145], or extra circuitry to reconfigure the circuit in the test mode, e.g., use a feedback structure to reconfigure the circuit into an oscillator mode where the oscillation frequency then indicates whether the circuit is faulty or fault-free [146].…”

Section: F Analog and Mixed-signal Testing And Design For Testabilitymentioning

confidence: 99%

Computer-aided design of analog and mixed-signal integrated circuits

2000

View full text Add to dashboard Cite

show abstract

“…The basic idea is to switch the Circuit Under Test (CUT) into an oscillator configuration during the test phase, as has been extensively discussed for several circuits (operational amplifiers, filters, data converters) [1][2][3]. During the test, a feedback loop is created to the CUT to produce self-sustained oscillations.…”

Section: Introductionmentioning

confidence: 99%