Abstract:The origin of nitrogen acceptor compensation in ZnSe:N has been studied by secondary ion mass spectrometry (SIMS) and infrared absorption (FTIR) measurements. Nitrogen-doped ZnSe layers were grown by atmospheric pressure metalorganic chemical vapor deposition. Ammonia gas was used as a nitrogen source. SIMS analysis has revealed that hydrogen was incorporated only into the ZnSe:N layer with the same concentration as nitrogen. FTIR measurements at 11 K strongly suggest the presence of N—H bonding at 3193 cm−1. … Show more
“…IR spectroscopy showed that MOVPE-grown ZnSe contained N-H complexes. 58,59 Annealing in nitrogen gas (N 2 ) increased the PL emission intensity whereas annealing in H 2 did not; the activation mechanism was attributed to the release of H 2 from N-H bonds. 60 In ZnSe grown by gas source MBE, undoped regions contained background levels of hydrogen Fig.…”
Acceptor doping of many II-VI compound semiconductors has proved problematic and doping of epitaxial mercury cadmium telluride (MCT, Hg 1-x Cd x Te) with arsenic is no exception. High-temperature (>400°C) anneals followed by a lower temperature mercury-rich vacancy-filling anneal are frequently required to activate the dopant. The model frequently used to explain p-type doping with arsenic invokes an amphoteric nature of group V atoms in the II-VI lattice. This requires that group VI substitution with arsenic only occurs under mercury-rich conditions either during growth or the subsequent annealing and involves site switching of the As. However, there are inconsistencies in the amphoteric model and unexplained experimental observations, including arsenic which is 100% active as grown by metalorganic vapor-phase epitaxy (MOVPE). A new model, based on hydrogen passivation of the arsenic, is therefore proposed.
“…IR spectroscopy showed that MOVPE-grown ZnSe contained N-H complexes. 58,59 Annealing in nitrogen gas (N 2 ) increased the PL emission intensity whereas annealing in H 2 did not; the activation mechanism was attributed to the release of H 2 from N-H bonds. 60 In ZnSe grown by gas source MBE, undoped regions contained background levels of hydrogen Fig.…”
Acceptor doping of many II-VI compound semiconductors has proved problematic and doping of epitaxial mercury cadmium telluride (MCT, Hg 1-x Cd x Te) with arsenic is no exception. High-temperature (>400°C) anneals followed by a lower temperature mercury-rich vacancy-filling anneal are frequently required to activate the dopant. The model frequently used to explain p-type doping with arsenic invokes an amphoteric nature of group V atoms in the II-VI lattice. This requires that group VI substitution with arsenic only occurs under mercury-rich conditions either during growth or the subsequent annealing and involves site switching of the As. However, there are inconsistencies in the amphoteric model and unexplained experimental observations, including arsenic which is 100% active as grown by metalorganic vapor-phase epitaxy (MOVPE). A new model, based on hydrogen passivation of the arsenic, is therefore proposed.
“…These results have been obtained either in OMVPE grown samples in which hydrogen was non intentional [11,17,18,20,21] or in samples in which hydrogen had been intentionally introduced either during the MBE growth [16] or by exposition to a hydrogen or deuterium radio frequency plasma [19]. In the case of arsenic in ZnSe, deuterium had been also substituted to hydrogen as the carrier gas and in this case, the deuterium related mode has also been reported [21].…”
“…The hydrogen passivation is one of the most important causes of the poor results of the p-type doping in MOVPE, 3 and the presence of N-H bonds in MOVPE-grown samples was confirmed experimentally. 10,11 On the other hand, the thermal treatment at relatively low temperatures leads to the extraction of the hydrogen from the samples, resulting in successful activation of the dopant. 3 Therefore the reconstruction of the excitonic spectra may be connected with the hydrogen removal from the samples.…”
The reconstruction of the bound excitonic spectra of MOVPE-grown ZnSe:N samples caused by thermal annealing was observed. The results of the low temperature photoluminescence, reflection and SIMS measurements show that this reconstruction is caused neither by the strain effect nor by the removal of hydrogen from the samples. The calculation of the defect structure and energy by the SCF MO LCAO method was carried out, and a new stable configuration of the N se center has been found. A model of reconstruction of the nitrogen centers is proposed, assuming that the transition of N Se centers from a less stable state with distorted T d configuration into the energetically more favorable distorted C 3v configuration occurs due to thermal annealing, resulting in the corresponding changes in the luminescence spectra.
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