“…Hysteresis is typically noticed in systems/devices that possess certain inertia, causing the value of a physical property to lag behind changes in the mechanism causing it; manifesting memory (Pershin and Di Ventra, 2011). Particularly in the case of nanoscale memristors, this inertia has been ascribed to Joule heating (Fursina et al, 2009), the electrochemical migration of oxygen ions (Nian et al, 2007) and vacancies (Yang et al, 2008), the lowering of Schottky barrier heights by trapped charge carriers at interfacial states (Hur et al, 2010), the phase-change (Wuttig and Yamada, 2007), the formation/rupture of conductive filaments (Kwon et al, 2010), Yang et al (2012) in a device's core, or even to some extent a combination of the aforementioned switching mechanisms.…”