1983
DOI: 10.1016/0025-5416(83)90181-7
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Orientation relationships in the secondary recrystallization of pure nickel

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Cited by 14 publications
(24 citation statements)
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“…It consists of grains with an average size of 250 -300 nm with occasional larger grains, approximately 500 nm in size. An aspect of grains in thin ÿlms, especially for FCC and BCC metals, is that they can exhibit a preferred texture (Blicharski and Gorczyca, 1978;Nutting, 1980, 1982;Borodkina and Orekhova, 1982;Lejeck and Sima, 1983). The standard explanation of this e ect is the preferential growth of grains oriented in the lowest surface energy conÿguration (Grant et al, 1988;Weiland et al, 1988).…”
Section: Au Membrane Microstructure Characterizationmentioning
confidence: 96%
See 1 more Smart Citation
“…It consists of grains with an average size of 250 -300 nm with occasional larger grains, approximately 500 nm in size. An aspect of grains in thin ÿlms, especially for FCC and BCC metals, is that they can exhibit a preferred texture (Blicharski and Gorczyca, 1978;Nutting, 1980, 1982;Borodkina and Orekhova, 1982;Lejeck and Sima, 1983). The standard explanation of this e ect is the preferential growth of grains oriented in the lowest surface energy conÿguration (Grant et al, 1988;Weiland et al, 1988).…”
Section: Au Membrane Microstructure Characterizationmentioning
confidence: 96%
“…This includes grain size, morphology, and crystallographic texture. Preferential grain orientations during ÿlm growth result from minimization of surface energies (Borodkina and Orekhova, 1982;Lejeck and Sima, 1983). Likewise, the average grain size scales with the ÿlm thickness due to an e ect called the "specimen thickness e ect," which depends upon grain boundaries being pinned by their surface grooves, occurring when the mean equivalent grain diameter is on the order of the ÿlm thickness (Beck et al, 1948;Mullins, 1958).…”
Section: Size E Ectsmentioning
confidence: 98%
“…[28]. Furthermore, from minimization of surface energies, preferential grain orientation during film growth may occur [29,30]. Thus, as the specimen size affects the micro-structural features and since a major cause of plastic anisotropy is texture, micro-films may be plastically anisotropic.…”
mentioning
confidence: 99%
“…Still another size effect pertains to the grain size, which in annealed films tends to scale with the thickness of the film [5,6]. Because smaller grains lead to a higher yield stress (the Hall-Petch relation [7,8,9]) or perhaps to a lower yield stress (the reverse Hall-Petch relation, valid for grains smaller than about 10 nm [10]), this size effect can be readily explained.…”
Section: Introductionmentioning
confidence: 99%
“…Because a texture frequently leads to a higher yield stress [5,6], this size effect can be readily explained. Still another size effect pertains to the grain size, which in annealed films tends to scale with the thickness of the film [5,6].…”
Section: Introductionmentioning
confidence: 99%