2012 IEEE International Reliability Physics Symposium (IRPS) 2012
DOI: 10.1109/irps.2012.6241936
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Organic Thin Film Transistor degradation under sunlight exposure

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Cited by 5 publications
(3 citation statements)
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“…In [32], the encapsulation strongly reduced the moisture/oxygen penetration, with tremendous benefits in terms of robustness against UV light. In [28]- [31] we showed that blue light has almost negligible permanent effects if the device is not biased during illumination, as it is confirmed in this work (see the data at 0V gate stress voltage), because it is unable to assist efficiently the photochemical reactions between H 2 O/O 2 and pentacene. On the contrary, in this work, blue light has a strong impact if device is biased, but the permanent transconductance reduction mainly comes from the stress induced interface trap generation, as in conventional silicon MOSFET devices.…”
Section: Discussionsupporting
confidence: 77%
“…In [32], the encapsulation strongly reduced the moisture/oxygen penetration, with tremendous benefits in terms of robustness against UV light. In [28]- [31] we showed that blue light has almost negligible permanent effects if the device is not biased during illumination, as it is confirmed in this work (see the data at 0V gate stress voltage), because it is unable to assist efficiently the photochemical reactions between H 2 O/O 2 and pentacene. On the contrary, in this work, blue light has a strong impact if device is biased, but the permanent transconductance reduction mainly comes from the stress induced interface trap generation, as in conventional silicon MOSFET devices.…”
Section: Discussionsupporting
confidence: 77%
“…For instance organic TFTs are sensitive to environment factors such as moisture, oxygen and other contaminants [7][8][9][10] and to light or UV exposure [11][12][13][14][15][16][17][18][19][20][21][22][23][24][25].…”
Section: Introductionmentioning
confidence: 99%
“…In fact, OTFTs are very sensitive to air and humidity exposure [5,6], and their characteristics change under illumination, with bias and with temperature [7]. Many works in the literature have addressed the OTFT stability and reliability under electrical stress [7][8][9][10][11][12], light [7,[11][12][13] and ultraviolet exposure [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%