2016
DOI: 10.1186/s11671-016-1710-4
|View full text |Cite
|
Sign up to set email alerts
|

Organic/Inorganic Nano-hybrids with High Dielectric Constant for Organic Thin Film Transistor Applications

Abstract: The organic material soluble polyimide (PI) and organic–inorganic hybrid PI–barium titanate (BaTiO3) nanoparticle dielectric materials (IBX, where X is the concentration of BaTiO3 nanoparticles in a PI matrix) were successfully synthesized through a sol–gel process. The effects of various BaTiO3 contents on the hybrid film performance and performance optimization were investigated. Furthermore, pentacene-based organic thin film transistors (OTFTs) with PI-BaTiO3/polymethylmethacrylate or cyclic olefin copolyme… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
14
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 17 publications
(15 citation statements)
references
References 35 publications
1
14
0
Order By: Relevance
“…Unlike the solution-based polymeric or organic–inorganic hybrid films, ultrathin film with a physical thickness below 20 nm has been deposited reliably with a precise thickness control while excellent dielectric performance was maintained via the iCVD process. C i – f (left), C i – E (middle), and J – E (right) characteristics of the hybrid dielectrics (Al concentration: 17.8%) with various thickness were shown in Figure c using MIM devices. The physical thickness of hybrid films was reduced to less than 20 nm without degradation of the insulating properties, resulting in a high C i of 250 nF/cm 2 and low J value below than 1 × 10 –7 A/cm 2 .…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Unlike the solution-based polymeric or organic–inorganic hybrid films, ultrathin film with a physical thickness below 20 nm has been deposited reliably with a precise thickness control while excellent dielectric performance was maintained via the iCVD process. C i – f (left), C i – E (middle), and J – E (right) characteristics of the hybrid dielectrics (Al concentration: 17.8%) with various thickness were shown in Figure c using MIM devices. The physical thickness of hybrid films was reduced to less than 20 nm without degradation of the insulating properties, resulting in a high C i of 250 nF/cm 2 and low J value below than 1 × 10 –7 A/cm 2 .…”
Section: Resultsmentioning
confidence: 99%
“…In previous studies, an organic–inorganic dielectric was generated simply by physically mixing inorganic particles into the polymer matrix via a solution process. Aside from the EOT scalability and flexibility, achieving a uniform dispersion of inorganic particles within the polymer matrix and smoothing the surface roughness are additional challenges for the solution process. , Other research efforts have proposed a method of making the organic–inorganic dielectric via solution process using organic monomers and inorganic precursors. , Although hybrid dielectrics with enhanced k values and mechanical flexibility have been demonstrated, it is still challenging to form an ultrathin dielectric that is thinner than a few tens of nanometers for EOT scaling without losing its dielectric performance. , In most cases, a relatively high dielectric thickness, mostly greater than 200 nm, is inevitable for the solution process to minimize the effect of defects such as pinholes and residual impurities stemming from the solution process. Therefore, it is highly desirable to develop ultrathin but high- k organic–inorganic hybrid dielectrics capable of improving the performance of flexible electronic devices.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…e performance of a TFT is greatly influenced by the properties of its dielectric layer. e dielectric layer is responsible for the accumulation of charge in the channel and leakage current in the device [52,53]. ere is a fundamental limitation on the thickness of a silicon-based gate dielectric that the oxides having a thickness less than 2 nm suffer from direct tunnelling current or leakage current [54].…”
Section: Demand For High-k Materialsmentioning
confidence: 99%
“…PMMA is known to promote charge carrier mobility at the semiconductor-insulator interface due to a low trap density and has a dielectric constant of 2.8 and resistivity of 2 x 10 15 Ω m [153]. PMMA thicknesses found in literature tend to be 400-600 nm [154]. PMMA for chemiresistors provides a fibrous structure and low chemical affinity and would provide enhanced molecular trapping for the targeted gas [148].…”
Section: Substrate Materials Stack Selectionmentioning
confidence: 99%