Optoelectronic properties of In₂S₃ thin films measured using surface photovoltage spectroscopy

Abstract

In recent years, In 2 S 3 thin films were widely used as buffer/window layer in thin film solar cells as an alternative to toxic CdS. In the present work, we demonstrate the potential of surface photovoltage spectroscopy for estimation of minority carrier diffusion length, band gap energy and refractive index of thermally evaporated In 2 S 3 thin films. The estimated minority carrier diffusion length of In 2 S 3 thin films from SPV measurements were 0.112 μm and 0.052 μm for films annealed at 250 and 300 °C respectively.

Determination of carrier lifetime in thermally evaporated In2S3 thin films by light induced transient grating technique

“…where, S 0 we fitted as 0.8 cm/s and 2.5 cm/s; n 0 is the equilibrium doping density, 3.6 × 10 11 cm −3 and 17.5 × 10 11 cm −3 in In 2 S 3 films annealed at 250 °C and 300 °C respectively. The equilibrium doping density of the films was estimated from the carrier mobility, 16 cm 2 /Vs and 4 cm 2 /Vs for films annealed at 250 °C and 300 °C [30] and respective resistivity of these samples are 1.06 × 10 6 Ω•cm and 0.89 × 10 6 Ω•cm, determined using Ohmic contacts. The fitted S int values (relation 5) in the LITG experiment increased from 3.1 × 10 5 to 16.3 × 10 5 cm/s and 1.2 × 10 5 to 6.7 × 10 5 cm/s with increase of ∆N in the layers.…”

Effect of Post-thermal Annealing on the Structural, Morphological, and Optical Properties of RF-sputtered In2S3 Thin Films

“…In our study, the In2S3 films were deposited at a temperature of 150 °C by applying a 20 W RF power, and subsequently, a post thermal annealing process was applied to as-deposited films at the temperatures of 350 °C and 450 °C under argon (Ar) atmosphere in a tube furnace, outside the deposition chamber unlike the existing studies in the literature. As a result of our literature review, we concluded that a lot of work has been done on thermal annealing of In2S3 films in the literature [19,[35][36][37][38][39]. However, as we mentioned above, in all these studies, the films were deposited by mostly thermal evaporation and CBD methods.…”

Optical and Recombination Parameters of CdS1−xTex Thin Films Obtained by the CMBD Method

“…The schematic diagram of the SPV measurement configuration was similar to what was previously described in the paper [21].…”