Optoelectrical properties of Ge10Se90 and Ge10Se85Cu5 thin films illuminated by laser beams

El-Bana, M.S.; Fouad, S.S.

doi:10.1007/s00339-018-1570-0

Cited by 34 publications

(14 citation statements)

References 44 publications

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“…Accordingly, the origin and nature of dielectric losses are interesting. The same observed behavior of the dissipation factor was also reported previously by others [56,57] When the energetic electron beam goes through the thin films, the passing electrons experience energy loss [58]. The probability of this energy lossis governed by the passage of electrons, if they pass inside the material then the loss is determined by the volume(VELF) energy loss function and if they pass over the surface of the material then the loss is determined by the surface(SELF) energy loss function.…”

Section: Dielectric Properties Of Zno Filmssupporting

confidence: 87%

“…The probability of this energy lossis governed by the passage of electrons, if they pass inside the material then the loss is determined by the volume(VELF) energy loss function and if they pass over the surface of the material then the loss is determined by the surface(SELF) energy loss function. These two functions can be estimated by using the following relations [58,59].…”

Section: Dielectric Properties Of Zno Filmsmentioning

confidence: 99%

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Investigation of dispersion parameters, dielectric properties and opto–electrical parameters of ZnO thin film grown by ALD

Zaka

Parditka

Erdélyi

et al. 2020

Optik

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Highly transparent zinc oxide thin films with varied layer thicknesses have been prepared on microscopic glass substrates at 200 °C. Films thickness was measured by stylus profilometer. The films have been investigated for their structure using X-Ray diffraction; the patterns showed their amorphous nature. The dispersion parameters i.e. refractive index (n) and extinction coefficient (k) are computed in the wavelength range (350 -2500 nm). The Tauc model was used to determine the optical band gap and Urbach tail with direct allowed transitions. The real and imaginary parts of the high frequency dielectric constant were discussed. Other parameters such as penetration depth, cut-off wavelength, dissipation factor, volume and surface energy loss functions, reflection loss factor, optical, electrical and thermal conductivities have also been determined. A systematic study of a wide range of optical parameters of ALD prepared ZnO films can serve as a valuable data source and can enrich the knowledge of the studied material.

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Section: Dielectric Properties Of Zno Filmssupporting

confidence: 87%

Section: Dielectric Properties Of Zno Filmsmentioning

confidence: 99%

Investigation of dispersion parameters, dielectric properties and opto–electrical parameters of ZnO thin film grown by ALD

Zaka

Parditka

Erdélyi

et al. 2020

Optik

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show abstract

“…Also, the appearance of localized states over the bandgap region and the non-appearance of long-range order makes chalcogenide materials show excellent tuning properties when exposed to external stimuli effects like doping effects and photo-induced effects, thermally annealed effects, etc. 3–27…”

Section: Introductionmentioning

confidence: 99%

A review on metal-doped chalcogenide films and their effect on various optoelectronic properties for different applications

Priyadarshini¹,

Das²,

Naik³

2022

RSC Adv.

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“…The optical energy gap was reduced by raising the Bi-metal powder concentration to 37 wt.% due to the increment of localized states (trapping centers). These states are close to the valence and conduction bands, as they exponentially move into the prohibited band [44]. The present flexible polymers have effective optical performance.…”

Section: Urbach's Tail Energy and Optical Energy Gap Calculationsmentioning

confidence: 69%

Microstructure Study And Linear/Nonlinear Optical Properties of Bi-Embedded PVP/ PVA Films For Optoelectronic And Optical CUT-OFF Applications

Ali

Abdelaziz

Sayed

et al. 2022

Preprint

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Hybrid polymer films of polyvinyl pyrrolidone (PVP)/ polyvinyl alcohol (PVA) embedded with gradient levels of Bi-powder were prepared using a conventional solution casting process. X-ray diffraction (XRD), Fourier transform infrared spectroscopic (FT-IR), and Scanning electron microscope (SEM) techniques have been used to examine the micro/molecular structural and morphological of the synthesized flexible films. The XRD peak intensity and FTIR spectra of the PVA gradually decline as Bi-metal is introduced. In addition, filler changes the microstructure surface of the pure film. The modification in the microstructure leads to an enhancement in the optical characteristic of the blend films. The indirect allowed transition energy was calculated via Tauc's and ASF models. The decrease in the hybrid film’s bandgap (\({E}_{gi}^{opt}\)) returns to the localized states in the forbidden region, as illustrated by the Urbach energy (Eu) values. The optical absorption parameters, including absorption coefficient (α) and edge (Ee), have also been evaluated. The relation between the transition energy and the refractive index (n) was studied. The rise of Bi-metal concentrations leads to an improvement in the nonlinear (χ(3)) susceptibility and (n2) refractive parameters. The optical limiting characteristics (OLC) revealed that the higher concentration dopant films reduce the light transmission intensity. The results suggest that hybrid films are promising materials in a wide range of applications, especially optical devices, and optoelectronics.

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Optoelectrical properties of Ge10Se90 and Ge10Se85Cu5 thin films illuminated by laser beams

Cited by 34 publications

References 44 publications

Investigation of dispersion parameters, dielectric properties and opto–electrical parameters of ZnO thin film grown by ALD

Investigation of dispersion parameters, dielectric properties and opto–electrical parameters of ZnO thin film grown by ALD

A review on metal-doped chalcogenide films and their effect on various optoelectronic properties for different applications

Microstructure Study And Linear/Nonlinear Optical Properties of Bi-Embedded PVP/ PVA Films For Optoelectronic And Optical CUT-OFF Applications

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