1989
DOI: 10.1002/jemt.1060110106
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Optimum specimen positioning in the electron microscope using a double‐tilt stage

Abstract: Optimal imaging of complex structures requires proper alignment relative to the optic axis of the electron microscope. This is especially important for high-voltage and intermediate-voltage microscopes, which form an in-focus image throughout the entire thickness of the object. As a result, structures at different specimen heights form overlapping and confused images that severely curtail the usefulness of these instruments. The work described here provides a generalized, flexible method for optimizing specime… Show more

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Cited by 4 publications
(1 citation statement)
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“…As one of the ultimate goals of 3-D reconstruction is tomography there is a need for a very high tilt series ( -60" to + 60" or more) (Skoglund et al, 1986;Harauz et al, 1987;Hegerl, 1989;Olins et al, 1989;Peachey &Heath, 1989) with, if possible, rotation of the section within the plane of the object-holder (Turner et al, 1989). However, until now the use of large tilt-series and of stereo-pairs has some limitations due to:…”
Section: Discussionmentioning
confidence: 99%
“…As one of the ultimate goals of 3-D reconstruction is tomography there is a need for a very high tilt series ( -60" to + 60" or more) (Skoglund et al, 1986;Harauz et al, 1987;Hegerl, 1989;Olins et al, 1989;Peachey &Heath, 1989) with, if possible, rotation of the section within the plane of the object-holder (Turner et al, 1989). However, until now the use of large tilt-series and of stereo-pairs has some limitations due to:…”
Section: Discussionmentioning
confidence: 99%