Optimized double-sided pattern design on a patterned sapphire substrate for flip-chip GaN-based light-emitting diodes

Che, Zhen; Zhang, Jun; Yu, Xinyu; Xie, Mengyuan; Yu, Jianhui; Lu, Huihui; Luo, Yunhan; Guan, Heyuan; Chen, Zhe

doi:10.1117/1.oe.54.11.115108

Cited by 6 publications

(2 citation statements)

References 20 publications

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“…Therefore, to substantially enhance the LEE of the LED, various textured structures have been proposed to avoid the occurrence of total internal reflection, including rough surfaces, patterned substrates, diffraction gratings, and photonic crystals. Experiments have proven that these textured structures can enhance the LEE, and that they all appear to function in the same manner by using light scattering effects to increase the probability of photon escape [3][4][5][6][7][8][9]. However, because most of the research is conducted using trial and error in the manufacturing process, it is not easy to obtain the optimal structural parameters; nor is it possible to further understand the impact of the light scattering factor on the LEE.…”

Section: Introductionmentioning

confidence: 99%

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Lee¹,

Chou²

2017

Preprint

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A multiscale model that enables quantitative understanding and prediction of the size effect on scattering properties of micro-and nanostructures is crucial for the design of LED surface textures optimized for high light extraction efficiency (LEE). In this paper, a hybrid process for combining full-wave finite-difference time-domain simulation and a ray-tracing technique based on a bidirectional scattering distribution function model is proposed. We apply this method to study the influence of different pattern sizes of a patterned sapphire substrate on GaN-based LED light extraction from the microscale to the nanoscale. The results show that near-wavelength-scaled patterns with strong diffraction are not expected to enhance LEE. By contrast, microscaled patterns with optical diffusion behavior have the highest LEE at a specific aspect ratio, and subwavelengthscaled patterns that have antireflection properties show marked enhancement of LEE for a wide range of aspect ratios.

show abstract

Section: Introductionmentioning

confidence: 99%

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Lee¹,

Chou²

2017

Preprint

View full text Add to dashboard Cite

show abstract

“…Therefore, to substantially enhance the LEE of the LED, various textured structures have been proposed to avoid the occurrence of total internal reflection, including rough surfaces, patterned substrates, diffraction gratings, and photonic crystals. Experiments have proven that these textured structures can enhance the LEE, and that they all appear to function in the same manner, namely by using light scattering effects to increase the probability of photon escape [3][4][5][6][7][8][9]. However, because research is typically conducted using trial and error during the manufacturing process, it is not easy to obtain the optimal structural parameters, nor is it possible to further understand the impact of the light scattering factor on the LEE.…”

Section: Introductionmentioning

confidence: 99%

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Lee

Chou

2017

Energies

View full text Add to dashboard Cite

A multiscale model that enables quantitative understanding and prediction of the size effect on the scattering properties of micro-and nanostructures is crucial for the design of light-emitting diode (LED) surface textures optimized for high light extraction efficiency (LEE). In this paper, a hybrid process for combining full-wave finite-difference time-domain simulation and a ray-tracing technique based on a bidirectional scattering distribution function model is proposed. We apply this method to study the influence of different pattern sizes of a patterned sapphire substrate on GaN-based LED light extraction from the micro-scale to the nano-scale. The results show that near-wavelength-scale patterns with strong diffraction are not expected to enhance the LEE. By contrast, micro-scale patterns with optical diffusion behavior have the highest LEE at a specific aspect ratio, and subwavelength-scale patterns that have antireflection properties show a marked enhancement of the LEE for a wide range of aspect ratios.

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Neighbour-die effect on the measurement of wafer-level flip-chip LED dies in production lines

Tengfei

Wan

2017

Journal of Modern Optics

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Optimized double-sided pattern design on a patterned sapphire substrate for flip-chip GaN-based light-emitting diodes

Cited by 6 publications

References 20 publications

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Scale-Dependent Light Scattering Analysis of Textured Structures on LED Light Extraction Enhancement Using Hybrid Full-Wave Finite-Difference Time-Domain and Ray-Tracing Methods

Neighbour-die effect on the measurement of wafer-level flip-chip LED dies in production lines

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