Optimization of the performance of a tandem microchannel plate detector as a function of interplate spacing and voltage

Rogers, Douglas; Malina, Roger F.

doi:10.1063/1.1137192

Cited by 18 publications

(8 citation statements)

References 10 publications

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“…The solid curve on Fig. 6 (10) and is a measure of the photoelectron image halo FWHM. This convolution is found to agree satisfactorily with the data at 304 A.…”

Section: Theoretical Analysismentioning

confidence: 99%

Maximizing the quantum efficiency of microchannel plate detectors: The collection of photoelectrons from the interchannel web using an electric field

Taylor

Hettrick

Malina

1983

Review of Scientific Instruments

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We report dependence of the extreme ultraviolet quantum efficiency (QE) of a microchannel plate (MCP) detector upon the electric field strength above its input face. Using an uncoated plate, we measured increases up to 80% as the field was raised from 0 V/μ to between 0.01 and 0.1 V/μ. Further increases in electric field resulted in a monotonic decrease in QE. Detector spatial resolution was found to degrade for these small field values but could be recovered, while maintaining most of the QE increase, by operating with fields in excess of 0.3 V/μ. Other detector parameters such as modal gain and output charge pulse-height distribution were not significantly affected by the applied electric field. We explain the QE and resolution variations in terms of photoelectrons ejected from the interchannel web and subsequently returned to the input face of the MCP by the applied electric field. We present a model and a computer simulation which quantitatively reproduce our experimental results. Applying our model to MCPs coated with photocathode materials, we conclude that the maximum QE is obtained by optimizing the combined contributions from the web area and open area of the MCP, rather than by maximizing the open area alone. In this case, most of the QE can arise from the interchannel web rather than from the directly illuminated channels.

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“…The solid curve on Fig. 6 (10) and is a measure of the photoelectron image halo FWHM. This convolution is found to agree satisfactorily with the data at 304 A.…”

Section: Theoretical Analysismentioning

confidence: 99%

Maximizing the quantum efficiency of microchannel plate detectors: The collection of photoelectrons from the interchannel web using an electric field

Taylor

Hettrick

Malina

1983

Review of Scientific Instruments

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“…1a) with spaced MCPs when a voltage difference dV is applied between the plates. We briefly comment on the electron dynamics in the interplate region 18 and during the expansion from the second MCP to the delay lines. The voltage between the plates accelerates the electrons between the two plates which otherwise travel in a zero electric field free space, with the result of (i) collimating the electron shower and (ii) transferring energy to the electrons.…”

Section: Influence Of Interplate Voltage DVmentioning

confidence: 99%

“…1a). With such spaced MCPs, the additional voltage, which increases electron energy and influences their collimation in between the plates, should raise the efficiency and increase the resolution of the detector 18,19 , but not all workers have observed such improvements 20 . Building on these ideas, we extend previous experimental investigations to the study of pairs of slightly separated MCPs using delay line anodes.…”

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confidence: 99%

Influence of gold coating and interplate voltage on the performance of chevron micro-channel plates for temporally and spatially resolved single particle detection

Hoendervanger

Clément

Aspect

et al. 2013

Review of Scientific Instruments

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We present a study of two different sets of Micro-Channel Plates used for time and space resolved single particle detection. We investigate the effects of the gold coating and that of introducing an interplate voltage between the spatially separated plates. We find that the gold coating increases the count rate of the detector and the pulse amplitude as previously reported for non-spatially resolved setups. The interplate voltage also increases count rates. In addition, we find that a non-zero interplate voltage improves the spatial accuracy in determining the arrival position of incoming single particles (by ~20%) while the gold coating has a negative effect (by ~30%).

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“…These experiments use a Comstock 7 model AC-902B™ with dual microchannel plate (MCP) detectors from Burle Corporation (model CP-618C)™. 8,9 The analyzer has line-of-sight access to the source through 2 ¾ in. CF ports positioned at angular intervals of 5° from 15° to 45°from the centerline of the pinch.…”

Section: Apparatus and Approachmentioning

confidence: 99%

XCEED: XTREME commercial EUV exposure diagnostic experiment

et al. 2005

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The XCEED chamber was designed to allow diagnostic access to the conditions experienced by collecting optics for a discharge produced plasma (DPP) source. The chamber provides access for EUV photodiodes, sample exposure tests, Faraday cup measurements, and characterization of the ion debris field by a spherical sector energy analyzer (ESA). The Extreme Ultraviolet (EUV) light source creates a xenon z-pinch for the generation of 13.5 nm light. Typical EUV emission is characterized though a control photodiode. The chamber also allows characterization of optic samples at varying exposure times for normal and grazing incidence reflection angles during tests lasting up to 40 million pulses. The principal investigation is characterization of the debris field and the erosive effects on optics present. Light emission from the z-pinch is followed by ejection of multiply-charged ions which can significantly damage nearby mirror surfaces. Characterization of the ejecta is performed with an ESA that diagnoses fast ion species by energy-tocharge ratio using ion time of flight (ITOF) analysis. The ITOF-ESA is used to characterize both the energy and angular distribution of the debris field. In the current paper, the ESA is applied only to the ion debris emitted from the source. The effects of total particle flux on mirror samples are investigated through exposure testing. Samples are exposed to the source plasma and surface metrology is performed to analyze erosion and deposition effects on mirrors within the source chamber.

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Optimization of the performance of a tandem microchannel plate detector as a function of interplate spacing and voltage

Cited by 18 publications

References 10 publications

Maximizing the quantum efficiency of microchannel plate detectors: The collection of photoelectrons from the interchannel web using an electric field

Maximizing the quantum efficiency of microchannel plate detectors: The collection of photoelectrons from the interchannel web using an electric field

Influence of gold coating and interplate voltage on the performance of chevron micro-channel plates for temporally and spatially resolved single particle detection

XCEED: XTREME commercial EUV exposure diagnostic experiment

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