Abstract:We report dependence of the extreme ultraviolet quantum efficiency (QE) of a microchannel plate (MCP) detector upon the electric field strength above its input face. Using an uncoated plate, we measured increases up to 80% as the field was raised from 0 V/μ to between 0.01 and 0.1 V/μ. Further increases in electric field resulted in a monotonic decrease in QE. Detector spatial resolution was found to degrade for these small field values but could be recovered, while maintaining most of the QE increase, by oper… Show more
“…The OPoSAP has a spatial resolution of approximately 0.25mm, and no degradation has been observed with grid bias as low as 15V. A more detailed analysis of the trajectory of photoelectrons has been performed by Taylor et al [9], who considered the effect on detector resolution in a UV imaging system, and their results were similar to those given here. Mass-to charge The grid potentials given in each case are quoted with respect to the front face of the MCP, which was set to -50V.…”
Section: Effect On Timing and Spatial Resolutionsupporting
confidence: 66%
“…Taylor et al [9] observed a drop off in the detection efficiency for incident photons at large grid bias, when the photoelectrons generated from the interchannel web failed to reach the nearest channel, and are returned instead to the web. However, this effect was only appreciable for larger applied fields than are applied here (up 1000V/mm), or for lower energy photoelectrons.…”
Abstract. The detection efficiency of a channel-plate detector is mainly determined by the open area ratio of its input face. which is typically 60%-70%. It is known that the efficiency can be enhanced by applying an electric field normal to the channel-plate surface, such that secondary electrons generated when ions strike the channel-plate surface are returned to the detector. This paper characterises the enhancement observed in channel-plate detectors for atom probe and 3-dimensional atom probe applications. In a double channel-plate detector, it was found that improvement in efficiency was approximately 30% as compared to the situation where all secondary events are lost. The secondary electron events are found to have a broader pulse height distribution, with a mean which is a factor of three lower than that of the primary ion events. Using the variation of efficiency with grid voltage, the maximum secondary electron energy was estimated to be IOeV. This value was used to calculate the loss in time and spatial resolution which would result from the detection of secondary electrons. These effects are shown to be acceptably small within a 3-dimensional atom probe detector design, for a wide range of bias voltages. Previous work has suggested that the efficiency gain from a biassed grid drops off at grid fields in the range 25-100V/mm. This effect is shown to have been generated by field fringing effects.
“…The OPoSAP has a spatial resolution of approximately 0.25mm, and no degradation has been observed with grid bias as low as 15V. A more detailed analysis of the trajectory of photoelectrons has been performed by Taylor et al [9], who considered the effect on detector resolution in a UV imaging system, and their results were similar to those given here. Mass-to charge The grid potentials given in each case are quoted with respect to the front face of the MCP, which was set to -50V.…”
Section: Effect On Timing and Spatial Resolutionsupporting
confidence: 66%
“…Taylor et al [9] observed a drop off in the detection efficiency for incident photons at large grid bias, when the photoelectrons generated from the interchannel web failed to reach the nearest channel, and are returned instead to the web. However, this effect was only appreciable for larger applied fields than are applied here (up 1000V/mm), or for lower energy photoelectrons.…”
Abstract. The detection efficiency of a channel-plate detector is mainly determined by the open area ratio of its input face. which is typically 60%-70%. It is known that the efficiency can be enhanced by applying an electric field normal to the channel-plate surface, such that secondary electrons generated when ions strike the channel-plate surface are returned to the detector. This paper characterises the enhancement observed in channel-plate detectors for atom probe and 3-dimensional atom probe applications. In a double channel-plate detector, it was found that improvement in efficiency was approximately 30% as compared to the situation where all secondary events are lost. The secondary electron events are found to have a broader pulse height distribution, with a mean which is a factor of three lower than that of the primary ion events. Using the variation of efficiency with grid voltage, the maximum secondary electron energy was estimated to be IOeV. This value was used to calculate the loss in time and spatial resolution which would result from the detection of secondary electrons. These effects are shown to be acceptably small within a 3-dimensional atom probe detector design, for a wide range of bias voltages. Previous work has suggested that the efficiency gain from a biassed grid drops off at grid fields in the range 25-100V/mm. This effect is shown to have been generated by field fringing effects.
“…36 Measurements on other microchannel plates yield collection efficiencies of about 90%, even for electron energies as low as 100 eV. 37 On scales of 10 |i to 1 mm, the collection efficiency varies less than 1% (consistent with statistical fluctuations in the measurement) over the area of the microchannel plate. 38,39 There are variations of 5% to 10% over scales larger than 5 mm.…”
represents that its use would not infringe privately owned ir^hls. Refer ence herein to any specific commerrial product, process, or service by trade name, itadcmark, manufacturer, or otherwise docs not necessarily oonstntute or nraply Els endorsement, recom mendation, ' &T favoring by 4he United States Government or any agency thereof. The views and ocanions-ctf authors expressed herein do ac& tKoessaTal}' suit or nfleci those cf the United Stales Gcnvmmcr.i or any agency ihcrcof. MASTER BlSTfiiBUTIOH OF THIS DOCUMENT IS UNLIMITED 3.3. Ion-signal pulse-height distribution 27 3.3.1. Effects of ion species, incidence angle, and energy on secondary-electron yield 3.4. Dark-noise and background pulse-height distributions and rates 3.4.1. Reducton of background by discrimination 3.4.2. Dark-noise stability 3.4.3. Sources of dark noise 3.5. Ion-counting efficiency versus dark-noise and background rates 3.5.1. Other criteria for choosing microchar.nel-plate voltage 3.6. Stability of gain, signal, and background after exposure to high currents or air 3.6.1. Experience and suggestions about exposure to air 3.7. Damage to electron multiplier from high-voltage discharge 3.7.1. Precautions to prevent damage 4. Operating ranges 4.1. Dynamic range and upper limit on anode current 4.2. Recovery time, maximum background rate, and low-energy background suppression 54 4.3. Ion-beam size and incidence angle 55 4.4. Operating pressures 56 4.5. Sensitivity to magnetic fields 57 4.6. Uniformity of response over microchannel plate and dynode surfaces 59 5. Conclusion 61 References 63 ion detector, and he gave me the opportunity to be eclectic in graduate school. Terry Mast lightened my load with insightful discussions and helped me to see the forest through the trees when I had lost my way. Luis Alvarez taught me to be sure of where I am headed and to report what I see clearly. Maynard Michel generously loaned me the use of an entire lab, including the wonderful mass separator he built, while I assembled and tested the detector. More important, he gave me the benefit of his time, knowledge,and experience from which I learned daily. Saul Perlmutter traveled this road beside me from the beginning to the end. He is a good listener and a fine companion. Ed Eberhardt answered countless questions about microchannel plates. Leonard Dietz provided critical information about secondary-electron emission. My parents had faith in me and encouraged me to find my own way. My daughter Erica put up with seeing me less than she wanted and greeted me joyfully when I came home. Most of all I thank Suzanne, for walking with me when the road is rocky. A Low Background-Rate Detector for Ions in the 5 to 50 keV Energy Range to be Used for Radioisotope Dating with a Small Cyclotron
“…They were covered with nearly transparent grids, which had negative voltage relative to the MCP front surfaces to maximize the detection efficiency [47,48]. The MCP for the projectile detection had a delay line anode to generate a position signal.…”
We report an experimental study of the charge-transfer process in collisions of Xe q+ ions (16 q 20) with magnesium atoms at an energy of 5.5q keV. With charge-selective and time-coincidence techniques, we separated the pure capture and capture accompanied by transfer-ionization processes. The experimental data indicate that the magnesium target is around two times more likely to lose two electrons than one in the collision. This finding is very different compared to the calculation based on the extended classic over-the-barrier model. The Xe q+ -Mg collision also behaves very differently from "traditional" collisions between highly charged ions and noble gases. We suggest a one-step dielectronic mechanism for the capture process. The data also show that autoionization dominates the relaxation process after the capture, and fluctuation of the autoionization fraction versus the projectile charge state indicates that for the relaxation processes, the projectile core structure plays a more important role than the detailed characteristics of the projectile states where the target electrons are initially captured.
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