2003
DOI: 10.2172/15003223
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Optimization of Processing and Modeling Issues for Thin Film Solar Cell Devices: Final Report, 24 August 1998-23 October 2001

Abstract: The overall mission of the Institute of Energy Conversion is the development of thin film photovoltaic cells, modules, and related manufacturing technology and the education of students and professionals in photovoltaic technology. The objectives of this 20 month NREL subcontract are to advance the state of the art and the acceptance of thin film PV modules in the areas of improved technology for thin film deposition, device fabrication, and material and device characterization and modeling, relating to solar … Show more

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Cited by 2 publications
(3 citation statements)
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“…The angular variation of density field (ρr 2 ) estimated from data using method of characteristics calculations is only a function of θ. The approximate relation for density variation is; ) 2 ( cos 2 2 ϕ πθ α ρ r (6) where ρ is the density of expanding gas, r -distance from jet source, θ -angle from the normal to jet source. The constant φ depends on specific heats ratio.…”
Section: Flux Distributions and Resulting Film Propertiesmentioning
confidence: 99%
See 1 more Smart Citation
“…The angular variation of density field (ρr 2 ) estimated from data using method of characteristics calculations is only a function of θ. The approximate relation for density variation is; ) 2 ( cos 2 2 ϕ πθ α ρ r (6) where ρ is the density of expanding gas, r -distance from jet source, θ -angle from the normal to jet source. The constant φ depends on specific heats ratio.…”
Section: Flux Distributions and Resulting Film Propertiesmentioning
confidence: 99%
“…Along a given gas stream line the speed of the gas (u) is essentially constant. The flux is give by the equation; u ρ = dA dM chalcogen (7) Combining equations (6) and 7 The thickness comparison that was shown schematically in Figure 33 was evaluated quantitatively. Figure 34 shows the measured thickness as a function of radial position across the substrate.…”
Section: Flux Distributions and Resulting Film Propertiesmentioning
confidence: 99%
“…This cos 3 θ dependence of effusion source distributions has also been measured at the Institute for Energy Conversion (IEC). 16 IEC reports no dependence of the profile on source metal, and no dependence on deposition rate over a 100× range of deposition rates. Thus -when combined with information on effusion source placement, source-to-substrate distance, substrate speed, and rate of material leaving the source -the cos 3 θ distribution is an adequate starting point to define the roll-coater metals flux profiles for the bell jar experiments.…”
Section: A Metals Flux Profilesmentioning
confidence: 99%