2010
DOI: 10.1002/pip.1032
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Optimization of interdigitated back contact silicon heterojunction solar cells: tailoring hetero‐interface band structures while maintaining surface passivation

Abstract: Interdigitated back contact silicon heterojunction (IBC‐SHJ) solar cells have the potential for high open circuit voltage (VOC) due to the surface passivation and heterojunction contacts, and high short circuit current density (JSC) due to all back contact design. Intrinsic amorphous silicon (a‐Si:H) buffer layer at the rear surface improve the surface passivation hence VOC and JSC, but degrade fill factor (FF) from an “S” shape J–V curve. Two‐dimensional (2D) simulation using “Sentaurus device” demonstrates t… Show more

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Cited by 83 publications
(67 citation statements)
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References 28 publications
(40 reference statements)
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“…The FF increases from 55% to >78% when E g of buffer layer reduces from 1.72 eV to 1.65 eV. All the above improvement in FF can be explained by the modification in band alignment and band offsets [10]. Using the present device dimensions, with a front SRV of 10 cm/s (a value consistent with our lifetime measurements of ~2 milliseconds), an efficiency of 22.8% can be reached (Fig.…”
Section: Improving Ff For S-shape J-vsupporting
confidence: 67%
“…The FF increases from 55% to >78% when E g of buffer layer reduces from 1.72 eV to 1.65 eV. All the above improvement in FF can be explained by the modification in band alignment and band offsets [10]. Using the present device dimensions, with a front SRV of 10 cm/s (a value consistent with our lifetime measurements of ~2 milliseconds), an efficiency of 22.8% can be reached (Fig.…”
Section: Improving Ff For S-shape J-vsupporting
confidence: 67%
“…This can result in J sc losses. This effect is known as electrical shading and has been extensively investigated both for homojunction and heterojunction back-contacted devices [32]- [34]. Eventually, back-contacted SHJ devices require bulk materials with sufficiently long carrier diffusion lengths to perform at their best [35], [36].…”
mentioning
confidence: 99%
“…8(e)). We therefore conclude that the drop in FF we observed in cells with thin a-SiO x :H passivation layers must indeed be a result of impeded hole collection due to a higher VB offset 51,56 which leads to an accumulation of holes. 57 The effect depends on the working point of the device and becomes more significant when moving from short-circuit to open-circuit conditions.…”
mentioning
confidence: 68%