2015
DOI: 10.1016/j.jcrysgro.2015.02.102
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Optimization of InAlAs buffers for growth of GaAs-based high indium content InGaAs photodetectors

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Cited by 12 publications
(5 citation statements)
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“…Again, a very narrow FWHM (~270 arcsec) is measured from the diffraction peak of the InGaAs layer. The FWHM value measured here is only about half of the reported values from InGaAs layers grown on InP and GaAs substrates using metamorphic buffers [12,13]. Such a low FWHM indicates high quality of the InGaAs layers.…”
Section: Resultscontrasting
confidence: 60%
“…Again, a very narrow FWHM (~270 arcsec) is measured from the diffraction peak of the InGaAs layer. The FWHM value measured here is only about half of the reported values from InGaAs layers grown on InP and GaAs substrates using metamorphic buffers [12,13]. Such a low FWHM indicates high quality of the InGaAs layers.…”
Section: Resultscontrasting
confidence: 60%
“…However, the lattice mismatch increases about 4% more for the InGaAs with the same indium content, which can further depredate the performance of the device. The work on In x Ga 1−x As PDs and FPAs of x > 0.53 on GaAs substrate are still done recently by using MBE and MOVPE, including our work [84][85][86][87] and those of other groups. [88,89] The main purpose is to gain the knowledge of higher lattice mismatch.…”
Section: Wavelength-extended Ingaas Pds and Fpasmentioning
confidence: 99%
“…In this work, four In 0.83 Ga 0.17 As PD structures with different buffer schemes were grown by GSMBE on S.I. (1 0 0)-oriented GaAs epi-ready substrates [38]. Each structure consisted of a 2.5-μm N + InAlAs MBL and a 1.5-μm n − In 0.83 Ga 0.17 As absorption layer followed by a 530 nm P + InAlAs cap.…”
Section: Optimization Of Inalas Metamorphic Buffer On Gaas With Relatmentioning
confidence: 99%