2020
DOI: 10.1016/j.jpowsour.2020.229105
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Optimization of CuInGaSSe properties and CuInGaSSe/CdS interface quality for efficient solar cells processed with CuInGa precursors

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Cited by 9 publications
(7 citation statements)
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“…It should be noticed that there is an all-dry process and no i-ZnO layer in the case of CIGSSe solar cells with Zn­(O,S) buffer, which could further simplify the fabrication process of CIGSSe solar cells. The preparation processes of other functional layers in this work are similar to that reported in our previous work . An 800 nm-thick Mo back contact was deposited on SLG by direct current magnetron sputtering.…”
Section: Methodsmentioning
confidence: 75%
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“…It should be noticed that there is an all-dry process and no i-ZnO layer in the case of CIGSSe solar cells with Zn­(O,S) buffer, which could further simplify the fabrication process of CIGSSe solar cells. The preparation processes of other functional layers in this work are similar to that reported in our previous work . An 800 nm-thick Mo back contact was deposited on SLG by direct current magnetron sputtering.…”
Section: Methodsmentioning
confidence: 75%
“…The preparation processes of other functional layers in this work are similar to that reported in our previous work. 34 An 800 nm-thick Mo back contact was deposited on SLG by direct current magnetron sputtering. Then, CuInGa (CIG) films as the precursors for the CIGSSe absorbers were obtained by sputtering with a ternary CIG alloy target.…”
Section: Methodsmentioning
confidence: 99%
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“…Similar degradation of the device performance, owing to undesired shunt paths, is also observed in the case of other chalcogenide solar cells with a high surface roughness. [47,48] Interestingly, the SnSe/CdS device fabricated with a moderately thick absorber layer (% 1.5 μm; growth duration of 20 min) exhibits improved shunt properties (low J sh and G s ). In this case, the SnSe thin film composed of moderate-sized grains with a modest surface roughness (root-mean-square roughness % 170 nm) exhibited a more uniform deposition of the CdS buffer layer, which significantly reduced the shunt losses at the grain boundaries.…”
Section: Resultsmentioning
confidence: 99%