Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)
DOI: 10.1109/essderc.2003.1256880
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Optimisation of metal connections in lateral DMOS transistors for driving applications

P. Gassot
1
,
B. Desoete
2
,
Renaud Gillon
3
et al.
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A Finite Element-Domain Decomposition Coupled Resistance Extraction Method with Virtual Terminal Insertion

Yang
1
,
Murata
2
,
Nakatake
3
2008
IEICE Transactions on Fundamentals of Electronics, Communicatio
2
0
2
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A Finite Element-Domain Decomposition Coupled Resistance Extraction Method with Virtual Terminal Insertion

Yang
1
,
Murata
2
,
Nakatake
3
2008
IEICE Transactions on Fundamentals of Electronics, Communicatio
2
0
2
0
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Fast Shape Optimization of Metallization Patterns for DMOS Based Driver

Yang
1
,
Nakatake
2
,
Murata
3
2008
9th International Symposium on Quality Electronic Design (Isqed 2008)
1
0
0
0
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A finite element-domain decomposition coupled resistance extraction method with virtual terminal insertion

Yang
1
,
Murata
2
2007
2007 50th Midwest Symposium on Circuits and Systems
4
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1
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