Optimal Design for Step-Stress Accelerated Degradation Tests

Liao, Chen-Mao; Tseng, Sheng‐Tsaing

doi:10.1109/tr.2005.863811

Cited by 211 publications

(119 citation statements)

References 8 publications

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“…Specially, the expressions for the log-like-lihood equations in (17) are calculated by applying (15) and constant activation energy as:…”

Section: Parameter Estimationmentioning

confidence: 99%

“…Tseng et al [23] presented an optimal test plan for the SSADT of carbon-film-resistors, and they performed a sensitivity analysis for the test plan. Cai and Liao [4,15] established a SSADT model and a test plan for the degradation of light emitting diodes. In order to obtain an accurate lifetime prediction, the design of the test plan should guarantee the failure mechanism and degradation mechanism keep unchanged at all accelerated stress levels.…”

Section: Introductionmentioning

confidence: 99%

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Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Lu¹,

Chen²,

Wang³

et al. 2017

EiN

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ConsistenCy analysis of degradation meChanism in step-stress aCCelerated degradation testing analiza niezmiennośCi meChanizmu degradaCji w przyspieszonyCh badaniaCh degradaCji z obCiążeniem stopniowymStep-stress accelerated degradation testing (SSADT) Lu X, Chen X, WAng Y, TAn Y. Consistency analysis of degradation mechanism in step-stress accelerated degradation testing. eksploatacja i niezawodnosc -Maintenance and Reliability 2017; 19 (2): 302-309, http://dx

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“…Specially, the expressions for the log-like-lihood equations in (17) are calculated by applying (15) and constant activation energy as:…”

Section: Parameter Estimationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Lu¹,

Chen²,

Wang³

et al. 2017

EiN

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show abstract

“…The most frequently used criteria include the (asymptotic) variance and mean squared error (MSE) of the estimator of the q-th quantile (or the mean) of the lifetime distribution at the use condition (Park and Yum [5]; Yu [6,7]; Li and Kececioglu [22,23]; Park and Yum [8]; Liao and Tseng [12]; Shi et al [9]; and Tseng et al [19]). In addition to these criteria, Boulanger and Escobar [4] and Liao and Elsayed [14] considered the generalized variance, namely, the determinant of the Fisher information matrix of the MLEs of unknown parameters, and Tang et al [11] considered the total experimental cost.…”

Section: Optimization Criterion and Constraintmentioning

confidence: 99%

“…These optimization criteria have been also used as constraint. Among constraints, the total experimental cost is frequently used (Li and Kececioglu [22]; Liao and Tseng [12]; and Tseng et al [19]). In addition to the constraint, Tang et al [11] considered the precision constraint using the asymptotic variance of the estimator of the mean lifetime at the use condition.…”

Section: Optimization Criterion and Constraintmentioning

confidence: 99%

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Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost

Lim

2015

Entropy

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An accelerated degradation test (ADT) is regarded as an effective alternative to an accelerated life test in the sense that an ADT can provide more accurate information on product reliability, even when few or no failures may be expected before the end of a practical test period. In this paper, statistical methods for optimal designing ADT plans are developed assuming that the degradation characteristic follows a gamma process (GP). The GP-based approach has an advantage that it can deal with more frequently encountered situations in which the degradation should always be nonnegative and strictly increasing over time. The optimal ADT plan is developed under the total experimental cost constraint by determining the optimal settings of variables such as the number of measurements, the measurement times, the test stress levels and the number of units allocated to each stress level such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized. In addition, compromise plans are developed to provide means to check the adequacy of the assumed acceleration model. Finally, sensitivity analysis procedures for assessing the effects of the uncertainties in the pre-estimates of unknown parameters are illustrated with an example.

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Stochastic modelling and analysis of degradation for highly reliable products

Xie

2014

Appl Stoch Models Bus & Ind

511

230

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Degradation models have become an important analytic tool for complex systems. During the last two decades, a number of degradation models have been developed to capture the degradation dynamics of a system and aid the subsequent decision-makings. This paper is aimed at providing a summary of the state of the arts in the field, and discussing some further research issues from both analytical and practical point of view. In this paper, degradation models are classified into three classes, that is, stochastic process models, general path models, and other models beyond these two classes. A review on the three classes is given with emphasis on the class of stochastic process models. A comprehensive comparison between stochastic process models and general path models is given to expound the pros and cons of these two methods. Applications of degradation models in degradation test planning and burn-in modelling will also be discussed.

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Optimal Design for Step-Stress Accelerated Degradation Tests

Cited by 211 publications

References 8 publications

Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Optimum Accelerated Degradation Tests for the Gamma Degradation Process Case under the Constraint of Total Cost

Stochastic modelling and analysis of degradation for highly reliable products

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