Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Lu, Xiang; Chen, Xun; Wang, Yashun; Tan, Ying

doi:10.17531/ein.2017.2.19

Cited by 10 publications

(7 citation statements)

References 29 publications

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“…Nelson carried out accelerated testing research systematically and proposed the classical cumulative exposure models. 1 This led to the flourishing development of accelerated life testing technology, mainly including data analysis methods for constant stress, step-stress, and progressive stress accelerated life tests, [2][3][4][5][6][7][8][9] optimal design methods, [10][11][12][13][14][15][16] and engineering applications. [17][18][19][20][21][22][23][24][25] However, mechatronic products generally undergo cyclic stresses during service.…”

Section: Introductionmentioning

confidence: 99%

Cyclic stress accelerated life test method for mechatronic products

Wang,

Hu,

Zhang

et al. 2024

Quality & Reliability Eng

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The reliability requirements for mechatronics continue to increase. Traditional life test methods make it difficult to obtain the data required to assess or predict the reliability of these mechatronic products within a reasonable time. Accelerated life tests can speed up the failure process of the product by using accelerated stress conditions. And then test data is obtained to predict the reliable life of the product under normal service conditions through modeling and analysis. The test efficiency of the accelerated life tests is higher than that of the life test. So, the method of accelerated life tests has become a solution for life and reliability prediction of highly reliable and long‐life mechatronic products. However, mechatronic products usually undergo cyclic stress during service. The use of cyclic stress as an accelerating stress in accelerated life tests can provide a realistic representation of service conditions and achieve higher test efficiency. Cyclic stress accelerated life test is an accurate and efficient solution for predicting the life and reliability of such mechatronic products. Current relative research is focused on constant stress, step stress and sequential stress accelerated life tests. A great challenge in engineering is modeling and analysis of cyclic stresses accelerated life tests. In this paper, we first describe the cyclic stress accelerated life test profile and its key parameters, then propose model assumptions and establish a modelling and analysis method for cyclic stress accelerated life test data, followed by an illustrative example to apply and validate the proposed method. The research results can provide technical support for the life and reliability assessment of mechatronic products under cyclic stress service conditions.

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Section: Introductionmentioning

confidence: 99%

Cyclic stress accelerated life test method for mechatronic products

Wang,

Hu,

Zhang

et al. 2024

Quality & Reliability Eng

Self Cite

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“…Accelerated testing (AT) extrapolates the life and performance information obtained under high stress level tests through reasonable statistical methods to obtain reliability or life estimates under conventional stress conditions, under the premise of ensuring that the failure mechanism of the product is not changed [12,32]. The failure process of the product is significantly accelerated and the test time is greatly shortened due to the application of accelerated stress [18]. Therefore, accelerated testing provides a feasible way for efficient reliability assessment of MIMU.…”

Section: Introductionmentioning

confidence: 99%

Reliability assessment for micro inertial measurement unit based on accelerated degradation data and copula theory

Chi¹,

Wang²,

Hu³

et al. 2022

Eksploatacja i Niezawodność – Maintenance and Reliability

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With its extensive use in industry, assessing the reliability of the micro inertial measurment unit (MIMU) has become a pressing need. Unfortunately, the MIMU is made up of several components, and the degradation processes of each are intertwined, making it difficult to assess the MIMU’s reliability and remaining useful life. In this research, we offer a reliability assessment approach for the MIMU, which has long-lifetime and multiple performance characteristics (PCs), based on accelerated degradation data and copula theory.Each PC model of MIMU is constructed utilizing drift Brownian motion to depict accelerated degradation process. The copula function is used to model the multivariate dependent accelerated degradation test data and to describe the dependency between multiple MIMU performance parameters. The particle swarm optimization algorithm is used to estimate the unknown parameters in the multi-dependent ADT model. Finally, the storage test and simulation example on MIMU’s accelerated degradation data verify the feasibility and effectiveness of the proposed method.

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“…Accelerated degradation test (ADT) collects performance degradation data of products at accelerated stress levels, and uses these data to extrapolate reliability and lifetime of products for the use conditions [20,23,33,34]. Mulloni studied the lifetime prediction of RF-MEMS switches based on ADT [22].…”

Section: Introductionmentioning

confidence: 99%

Lifetime prediction method for MEMS gyroscope based on accelerated degradation test and acceleration factor model

Liu

Wang

Fan

et al. 2020

Eksploatacja i Niezawodność – Maintenance and Reliability

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Lifetime prediction method for memS gyroScope baSed on acceLerated degradation teSt and acceLeration factor modeL metoda prognozowania czaSu pracy żyroSkopu memS na podStawie teStu przySpieSzonej degradacji i modeLu wSpółczynnika przySpieSzenia The reliability analysis of MEMS gyroscope under long-term operating condition has become an urgent requirement with the enlargement of its application scope and the requirement of good durability. In this study we propose a lifetime prediction method for MEMS gyroscope based on accelerated degradation tests (ADTs) and acceleration factor model. Firstly, the degradation characteristic (bias instability) is extracted based on Allan variance. The effect of temperature stress on the degradation rate of bias instability is analyzed, and it shows that the degradation rate of bias instability would increase with the increase of the temperature. Secondly, the ADTs of MEMS gyroscope are designed and conducted, the degradation model of MEMS gyroscope is established based on the output voltage of MEMS gyroscope and Allan variance. Finally, the acceleration factor model of MEMS gyroscope under temperature stress is derived, and the lifetime of the MEMS gyroscope is predicted based on two group tests data under high stress level. The results show that the lifetime calculated by the acceleration factor model and mean lifetime under high stress levels is close to the mean lifetime calculated by the linear equation at normal temperature stress.

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Consistency analysis of degradation mechanism in step-stress accelerated degradation testing

Cited by 10 publications

References 29 publications

Cyclic stress accelerated life test method for mechatronic products

Cyclic stress accelerated life test method for mechatronic products

Reliability assessment for micro inertial measurement unit based on accelerated degradation data and copula theory

Lifetime prediction method for MEMS gyroscope based on accelerated degradation test and acceleration factor model

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