2005
DOI: 10.1117/12.624825
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Optical thin films deposition by MDECR-PECVD

Abstract: We designed and built Matrix Distributed ECR (MDECR) PECVD reactor dedicated for dielectric filters deposition and equipped it with multiple sensors for process control. Planar matrix geometry of plasma source is based on electron cyclotron resonance effect at 2.45 GHz microwave frequency and provides scalability of the deposition on large area substrates. High (up to 5 nm/sec) deposition rate obtained due to high dissociation efficiency and careful design of the gas injection system. Optical emission spectros… Show more

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Cited by 4 publications
(4 citation statements)
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References 6 publications
(8 reference statements)
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“…Figure 1 shows the different parts of the reactor. A detailed description of this reactor is given in references [6,7]. The used UVISEL ellipsometer allows in-situ measurement of 32 different wavelengths, with a sampling period lower than one second.…”
Section: The Reactormentioning
confidence: 99%
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“…Figure 1 shows the different parts of the reactor. A detailed description of this reactor is given in references [6,7]. The used UVISEL ellipsometer allows in-situ measurement of 32 different wavelengths, with a sampling period lower than one second.…”
Section: The Reactormentioning
confidence: 99%
“…Spectroscopic ellipsometry represents an accurate method for characterization of the index and the growth rate for the different materials based on silicon oxynitride. After characterization of the different materials, new data can be generated to simulate kinetic trajectories for multi-channel ellipsometry in real-time control [6].…”
Section: Control Of Deposition By Ellipsometrymentioning
confidence: 99%
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“…The matrix distributed electron cyclotron resonance (MDECR) reactor [9] used during this study, consists of a 50 liter cylindrical vacuum chamber, connected to a 1600 l/s turbomolecular pump as shown in Fig. 1.…”
Section: Deposition Chambermentioning
confidence: 99%