Optical scattering of nanocrystalline Pb(ZrxTi1−x)O3 films

Orientation Dependent Dielectric Characteristics of Nanocrystalline Pb(ZrxTi1-x)O3Films with Inter Digital Electrodes

“…Values of loss angles of 150 nm and 500 nm films stayed in the region of tan δ < 0.02 all the way to phase transition temperature. These films were well crystallized to single tetragonal or trigonal phases and possessed well defined microstructure, with grain sizes in the range of 10 nm [13]. Phase transitions at around 320 • C in 200 nm film post-annealed at temperature of 800 • C was seen as an increase in loss angle values.…”

“…Surface roughness for single phase oriented films was low (R q < 10 nm) and bearing area curves steep with symmetric and narrow surface height amplitude distribution function (ADF), while surface roughness of films with tetragonal-trigonal phase co-existence was high (R q ≈ 25 nm) and bearing area curves gentler with asymmetric and broad ADF. Average grain sizes of the films post-annealed at 700 • C and 800 • C were in the range of 10 nm according to Warren-Averbach analysis [12,13].…”

Dielectric and Tunability Properties of Nanostructured Nd-modified Pb(ZrxTi1-x)O3Thin Films up to Microwave Frequencies

“…Raman spectra above ∼900 cm −1 also indicates that no other than pure ABO 3 perovskite Pb(Zr x Ti 1-x )O 3 phase is present in the thin films. According to Warren-Averbach analysis, average grain sizes of the films were around ∼10 nm [8].…”