Optical reflection and transmission through a flat system with a thick fluctuating layer

Abstract

In the theoretical description of reflection and transmission coefficients through a system with a layer much thicker than the wavelength the fluctuations of the thickness Δd/d and the spectrometer resolution Δλ/λ must be taken into consideration. The connection between the measured averaged values and the reflection and transmission coefficients from the front and back sides into the substrate is given by a Fourier sum. The total averages correspond to the summation over all light intensities caused by multiple incoherent internal reflections inside the substrate layer. As a special result of this analysis the measurement of the absorption in a thin layer by only reflection measurement will be demonstrated in a following paper. For smaller fluctuations the distribution function or better its Fourier components can also be measured by the analysis of the remaining interference effects.

Photoluminescence ofHgTe∕Hg1−xCdxTesuperlattices and a study of min

“…A dewar with ZnSe windows was employed for the lowtemperature measurements, which limited the transmission to energies above approximately 60 meV or wavelengths below 20 m. The absorption coefficient was determined by fitting the experimental transmission spectra to a theoretical description of the multilayer system using standard matrix procedures. 11 PL measurements were conducted either with a Fourier transform spectrometer, Bruker IFS88, or a SPEX 750M monochromator using either a liquid-nitrogen-cooled Hg 1−x Cd x Te or InSb detector. The PL was activated by a GaAs based laser diode in the former device and an argon ion laser in the latter.…”

General Treatment of Slab Waveguides Including Lossy Materials and Arbitrary Refractive Index Profiles

“…Leaky and surface waves in the asymmetrical waveguide-configuration were treated in [ 11, by Ogusu [3], Neviere [4], and Hsue [5]. Multilayer configurations were examined by Shakir [B], Fasold [7], and Popov [8].…”