2020
DOI: 10.1039/d0cp04021e
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Optical properties of thickness-controlled PtSe2thin films studiedviaspectroscopic ellipsometry

Abstract: Platinum diselenide (PtSe2) has attracted rich attention due to its intriguing physical properties for both fundamental research and promising applications in electronics and optoelectronics. Here, we explored the optical properties...

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Cited by 21 publications
(32 citation statements)
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“…Then, the optical constants and absorption properties were investigated by the SE analysis and transmission spectra, as shown in Figure . As a noncontact and nondestructive technique, [ 38,39 ] SE has been extensively used in bulk materials, films, and even complex structures to explore their optical constants and dielectric properties. Two basic sets of data, psi ( ψ ) and delta (Δ), are collected in the measurements of Ga 2 O 3 thin films, which can be defined as follows [ 40 ] ρ = r normalp / r normals = tan ( ψ ) exp ( i Δ ) where r p and r s represent the complex ratios of Fresnel reflection coefficients for p‐ and s‐polarized light, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Then, the optical constants and absorption properties were investigated by the SE analysis and transmission spectra, as shown in Figure . As a noncontact and nondestructive technique, [ 38,39 ] SE has been extensively used in bulk materials, films, and even complex structures to explore their optical constants and dielectric properties. Two basic sets of data, psi ( ψ ) and delta (Δ), are collected in the measurements of Ga 2 O 3 thin films, which can be defined as follows [ 40 ] ρ = r normalp / r normals = tan ( ψ ) exp ( i Δ ) where r p and r s represent the complex ratios of Fresnel reflection coefficients for p‐ and s‐polarized light, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…We also used Raman spectroscopy to confirm that the thickness dependence of the amplitude ratio of E g and A 1g modes agrees with previous studies (Figure S2, Supporting Information). [43,48] Structural characterizations are provided in Figure S3, Supporting Information.…”
Section: Steady-state Exciton Characteristicsmentioning
confidence: 99%
“…We attribute this absorption peak to the exciton resonance because the energy position agrees with both the calculated direct-gap exciton state (2.2 eV) [46] and also the exciton energy recently observed by ellipsometry in a 1L-thick PtSe 2 thin-film (2.18 eV). [48] To better understand the observed exciton resonance, we calculated the electronic band structure of 1L PtSe 2 using the G 0 W 0 approximation (see Experimental Section for details). The result is shown in Figure 1e, where the indirect band-gap marked by the green line is ≈2.53 eV, which is lower than the direct band-gap (solid black line; ≈2.8 eV).…”
Section: Steady-state Exciton Characteristicsmentioning
confidence: 99%
“…[31] Nevertheless, we should note that the out-of-plane dielectric component of layerd materials such as MoS 2 can be extracted by thicker samples with substrates that can provide large interference enhancement such as the SiO 2 /Si substrate. [29] Moreover, to test whether there is any possible inplane anisotropy of the large-area single-crystalline MoS 2 monolayer, we adopt the generally accepted method [32] to rotate the azimuthal angle of the sample within 0 to 60 based on the hexagonal symmetry of 2H-MoS 2 and perform ellipsometry measurements. As shown in Figure S3, Supporting Information, there is no significant difference between the ellipsometric data collected at different azimuthal angles.…”
Section: Resultsmentioning
confidence: 99%