2005
DOI: 10.1103/physrevb.72.155319
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Optical properties of Si nanocrystals embedded inSiO2

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Cited by 40 publications
(32 citation statements)
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“…A layer accounting for surface roughness was added too. The procedure to extract the dielectric function of the nanoparticles from optical measurements in the visible-UV has been described elsewhere [14]. Similar structures and dielectric functions were obtained on both substrates showing that a similar microstructure (size of nanoparticules, crystalline fraction.…”
Section: Resultsmentioning
confidence: 99%
“…A layer accounting for surface roughness was added too. The procedure to extract the dielectric function of the nanoparticles from optical measurements in the visible-UV has been described elsewhere [14]. Similar structures and dielectric functions were obtained on both substrates showing that a similar microstructure (size of nanoparticules, crystalline fraction.…”
Section: Resultsmentioning
confidence: 99%
“…32 Each layer was modeled as a mixture of silicon monoxide and silicon dioxide with Si inclusions using the Bruggemann effective medium approximation. 33 The two silicon monoxide and silicon dioxide matrix materials were individually modeled as Cauchy layers, while the nano-crystalline silicon inclusion material was modeled using three Gauss oscillators following the work of Gallas et al 34 For the TEM investigations, specimens were prepared from type B samples. Cross-sectioning was carried out conventionally by cutting, grinding, and subsequent ion milling.…”
Section: Methodsmentioning
confidence: 99%
“…Comparison with recent measurements of the linear dielectric function of Si NCs [11,12] is also instructive. For 4.5 to 6 nm diameter Si NCs, these measurements show a slight blue shift of the E 1 critical point energy, qualititatively consistent with our SHG spectrum of 3 nm Si NCs.…”
Section: Nc At Entrance Scanmentioning
confidence: 94%