2003
DOI: 10.1103/physrevb.67.195106
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Optical properties of polycrystalline metallic films

Abstract: We extend the Mayadas and Shatkes's approach ͓Phys. Rev. B 1, 1382 ͑1970͔͒ to study the optical properties of polycrystalline metal thick films in the visible and far infrared range of the spectrum. We show that in this range grain boundary scattering can account for the experimentally observed lowering of the film reflectivity as the mean size of its constituent grains decreases.

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Cited by 25 publications
(21 citation statements)
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References 29 publications
(43 reference statements)
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“…For the films containing grains of 45 nm size (the largest ones studied in Ref. [45]) the reflectance at λ ∼ (750 − 800)nm is 0.8% less than the one calculated from the tabulated data (notice that for smaller grains the difference of the reflectance obtained from the tabulated data is greater). Taking into account that the reflectance in the region of the infrared optics is given by [46] …”
Section: Experimental Precision In the Casimir Force Measure-mentmentioning
confidence: 92%
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“…For the films containing grains of 45 nm size (the largest ones studied in Ref. [45]) the reflectance at λ ∼ (750 − 800)nm is 0.8% less than the one calculated from the tabulated data (notice that for smaller grains the difference of the reflectance obtained from the tabulated data is greater). Taking into account that the reflectance in the region of the infrared optics is given by [46] …”
Section: Experimental Precision In the Casimir Force Measure-mentmentioning
confidence: 92%
“…According to Ref. [45], the largest deviations of the reflectance from the one given by the tabulated data [40], takes place at shorter wavelengths. The shortest separation of z = 62 nm in the experiment [11] corresponds to the characteristic wavelength λ c = 2πc/ω c = 4πz ≈ 780 nm.…”
Section: Experimental Precision In the Casimir Force Measure-mentmentioning
confidence: 99%
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“…The crossover between these behaviours is material dependent but is typically located at a lengthscale in the tens of nanometres. Similarly, the optical properties of crystalline materials are also dependent on the distribution of defects due to, for example, scattering from grain boundaries [12] or pores [13]. Defects and grain boundaries may arise from the presence of impurities in a crystal [14,15,16] and thus controlling the concentration and morphology of impurities allows the tuning of material properties.…”
Section: Introductionmentioning
confidence: 99%
“…It might, however, be taken into account by using a modified dielectric function. 30 While the geometries of the two cases differ substantially, an initial characterization might not be able to show the difference. Figure 2 shows the scattering cross sections of both antennae upon x-polarized plane wave excitation incident from the þz-direction.…”
mentioning
confidence: 99%