Nitride Semiconductor Devices: Principles and Simulation 2007
DOI: 10.1002/9783527610723.ch18
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Optical Properties of Edge‐Emitting Lasers: Measurement and Simulation

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“…This influences the threshold current, however, it should not influence the threshold current density (j th ) because in index-guided nitride LDs the threshold current scales linearly with ridge width. 29) Figure 1 shows the band profiles and wavefunctions distribution for a thin 2.6 nm and a wide 10.4 nm QWs calculated for: (a) no current injection j = 0 A cm −2 and (b) current injection j = 100 A cm −2 . The band profiles have been calculated with the SiLense 5.4 package.…”
mentioning
confidence: 99%
“…This influences the threshold current, however, it should not influence the threshold current density (j th ) because in index-guided nitride LDs the threshold current scales linearly with ridge width. 29) Figure 1 shows the band profiles and wavefunctions distribution for a thin 2.6 nm and a wide 10.4 nm QWs calculated for: (a) no current injection j = 0 A cm −2 and (b) current injection j = 100 A cm −2 . The band profiles have been calculated with the SiLense 5.4 package.…”
mentioning
confidence: 99%