“…A suite of opto-electronic characterization techniques has been used in the past to explore the various characteristics of these cells. Extensive light bias and voltage bias dependent external quantum efficiency measurements [3–10], detailed current-voltage (I–V) characterization [11], and electroluminescence measurements [12,13] have traditionally been used to elucidate various artifacts and phenomena such as low shunt resistance effects [3,6,7,9,14,15], reverse breakdown voltage [3,4,16], and luminescence coupling (LC) [10,11,17–21] in these devices. Furthermore, new techniques such as electric modulus spectroscopy [22] have been used to observe charge coupling effects in Ge-based triple junction solar cells.…”