2008
DOI: 10.1016/j.jallcom.2007.09.034
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Optical constants of TiO1.7 thin films deposited by electron beam gun

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Cited by 27 publications
(14 citation statements)
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“…the adsorbate-induced change in reflectivity, for E t,p and E n,p may change if the angle of incidence, , or the refractive index of substrate, n s , change. In our setup with =85°, R/R 0 for E t,p and E n,p can only change sign when the substrate refractive index is unphysically large n s >11.43 (the refractive index n s is expected to be approximately 1.9 and 2.4 for reduced and stoichiometric TiO 2 surfaces, respectively 52,53 ). This also implies that the critical angle of incidence for R/R 0 to change sign is ° and °, respectively, for these values of n s , i.e.…”
Section: A Polarization Angle and Substrate Dependence On Irras Meamentioning
confidence: 92%
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“…the adsorbate-induced change in reflectivity, for E t,p and E n,p may change if the angle of incidence, , or the refractive index of substrate, n s , change. In our setup with =85°, R/R 0 for E t,p and E n,p can only change sign when the substrate refractive index is unphysically large n s >11.43 (the refractive index n s is expected to be approximately 1.9 and 2.4 for reduced and stoichiometric TiO 2 surfaces, respectively 52,53 ). This also implies that the critical angle of incidence for R/R 0 to change sign is ° and °, respectively, for these values of n s , i.e.…”
Section: A Polarization Angle and Substrate Dependence On Irras Meamentioning
confidence: 92%
“…For a stoichiometric surface, we use n s =2.4, and for the reduced surface, n s =1.9 is used. 52,53 The wavenumber-dependent polarizability is calculated by summation of the electronic ( e ) and the vibrational ( v ) parts of all the normal modes, expressed as Lorentz oscillators, as follows:…”
Section: Three-layer Model For Irras Spectra Simulationmentioning
confidence: 99%
“…For dielectric surfaces, DR s remains always negative, while DR p can be negative or positive depending on the incidence angle and the refractive index n of the substrate. The refractive index decreases from 2.4 for the oxidized r-TiO 2 (110) to a value below 2.0 for the reduced one [170]. This difference in optic properties originates from the doping of TiO 2 via O vacancies created on the reduced r-TiO 2 (110) surface.…”
Section: No/tiomentioning
confidence: 96%
“…The properties of the investigated TiO 2 thin films could be treated as a single oscillator at wavelength λ 0 at high frequency. The high-frequency dielectric constant (ε ∞ ) can be calculated by applying the following simple classical dispersion relation [45]:…”
Section: Optical Characterizationmentioning
confidence: 99%