2010
DOI: 10.1016/j.tsf.2009.09.002
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Optical characterization of thin chalcogenide films by multiple-angle-of-incidence ellipsometry

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Cited by 30 publications
(28 citation statements)
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“…6, the angle Φ 1 values of incidence of the MDMO-PPV polymer increase with increasing photon energy until about 2.38 eV, then they change very little with increasing photon energy and decrease with decreasing molarity. The Φ 1 values of the MDMO-PPV polymer are close to incidence values of some materials in the literature [41][42][43][44]. Similarly, the angle of refraction is calculated from well-known Snell's law [45]:…”
Section: Resultssupporting
confidence: 73%
See 1 more Smart Citation
“…6, the angle Φ 1 values of incidence of the MDMO-PPV polymer increase with increasing photon energy until about 2.38 eV, then they change very little with increasing photon energy and decrease with decreasing molarity. The Φ 1 values of the MDMO-PPV polymer are close to incidence values of some materials in the literature [41][42][43][44]. Similarly, the angle of refraction is calculated from well-known Snell's law [45]:…”
Section: Resultssupporting
confidence: 73%
“…It is observed that the refractive index of the MDMO-PPV polymer decreases with increasing wavelength and the refractive index can be changed with various solvents. The refractive index values of the MDMO-PPV are close to n values in the literature [41,43,44,54,[59][60][61].…”
Section: The Effects On Optical Parameters Of the Mdmo-ppv Polymer Ofsupporting
confidence: 84%
“…We have demonstrated that the spectrophotometric and ellipsomeric methods offer a good accuracy for determination of the optical parameters of thin chalcogenide films from /30 to 2 ( is working wavelength) (Konstantinov et al 1998, Babeva et al 2001, Todorov et al 2010a. Results on the reflectance response of photonic crystals from chalcogenide glass/polymer (DeCorby et al, 2005;Kohoutek et al, 2007a) or chalcogenide glass/chalcogenide glass, e.g.…”
Section: Optical Methods For Control and Characterization Of Thin Filmentioning
confidence: 99%
“…The optical constants are obtained by determination of optical phase angle using reflectance measurements at normal incidence and KK relations. The ellipsometric diagnostic method has been also paid attentions for the determinations of the optical constants of metal and dielectric films [38][39][40][41][42][43][44]. The ellipsometric method is with higher measurement accuracy in comparison with other methods.…”
Section: Introductionmentioning
confidence: 99%