Optical and structural properties of sputtered CdS films for thin film solar cell applications

Kim, Donguk; Park, Young; Kim, Minha; Choi, Young-Kwan; Park, Yong Seob; Lee, Jaehyoeng

doi:10.1016/j.materresbull.2015.03.024

Cited by 45 publications

(14 citation statements)

References 29 publications

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“…Concerning all the samples, the (002) peak has the highest intensity subsequently the (002) is the preferred orientation. This is similar to the result obtained by [23] in his research about CdS thin films. The peak intensity is unquestionably affected by the increasing of the doping concentration; in a way that makes it less and less intense, indicating a degradation of the CdS crystallinity, this is in accordance with the results reported by [24].…”

Section: Characterizationssupporting

confidence: 92%

Spin-coated nickel doped cadmium sulfide thin films for third harmonic generation applications

Chtouki

Kouari

Kulyk

et al. 2017

Journal of Alloys and Compounds

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Section: Characterizationssupporting

confidence: 92%

Spin-coated nickel doped cadmium sulfide thin films for third harmonic generation applications

Chtouki

Kouari

Kulyk

et al. 2017

Journal of Alloys and Compounds

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“…Observation of these elements is similar to our findings presented in Figures 7 and 9. The XRD analysis presented in Figure 10 and Table 4 confirm preferentially oriented (002) plane located at 26.5 • , which was also observed by Toma et al [25] and Kim et al [37]. They also used sputtering for CdS deposition.…”

Section: Discussionsupporting

confidence: 79%

RF/DC Magnetron Sputtering Deposition of Thin Layers for Solar Cell Fabrication

Gulkowski

Krawczak

2020

Coatings

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Thin film Cu(In,Ga)Se2 (CIGS)-based solar cells with relatively high efficiency and low material usage might become a promising alternative for crystalline silicon technology. The most challenging task nowadays is to decrease the PV module fabrication costs by application of easily scalable industrial process. One of the possible solutions is the usage of magnetron sputtering system for deposition of all structures applied in CIGS-based photovoltaic device. The main object of these studies was fabrication and characterization of thin films deposited by sputtering technique. Structural and electrical properties of the sputtered films were analyzed using scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDS), X-ray Powder Diffraction (XRD), and four-point probe resistivity measurements. The presented findings revealed technological parameters for which sheet resistance of molybdenum (Mo) back contact decreased up to 0.3 Ω/□ and to even 0.08 Ω/□ in case of aluminum layer. EDS analysis provided evidence for the appropriate stoichiometry of CIGS absorber (with CGI and GGI equal to 0.96 and 0.2, respectively). XRD characterization confirmed high-quality chalcopyrite polycrystalline structure of Cu(In,Ga)Se2 film fabricated at relatively low substrate temperature of 400 °C. Characteristic XRD peaks of hexagonal-oriented structures of sputtered CdS and i-ZnO layers were noticed.

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“…An annealed temperature of 300 o C and 400 o C increased the lattice constant (5.776 Å and 5.772 Å), approaching this of the standard constant (5.830 Å). This indicates the relaxation of internal stress induced during film growth and the improvement of crystallinity in the CdS films [18]. Moreover, lattice parameters of the films were shifted smaller angels indicating an increase in the interplanar spacing from 3.271 to 3.335 Å with the increase in annealing temperatures.…”

Section: Crystal Structural Properties Of the Cds Filmsmentioning

confidence: 85%

Kimyasal Banyo Depolama Yöntemi ile Elde Edilen CdS Filmlerinin Tavlama Sıcaklığının Kristal, Optiksel ve Yapısal Özellikleri Üzerine Etkisi

Aybek

Rüzgar

2017

SAÜ Fen Bilimleri Enstitüsü Dergisi

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Kadmiyum sülfür filmleri kimyasal banyo depolama yöntemi ile cam tabanlar üzerine biriktirildi. Elde edilen filmler azot gazında 1 saat boyunca 200-400 o C sıcaklık aralığında tavlandı. Filmlerin kristal yapısı x-ışını kırınım (XRD) desenlerinden belirlendi. XRD verileri, tavlama etkisiyle CdS (FCC) yapısından α-CdS (Hawleyite) formuna geçiş olduğunu gösterdi. Elde edilen CdS filmlerinin optiksel bant aralığı değerleri optiksel absorbans spetrumlarından yararlanılarak 2,33 ve 2,39 eV olarak belirlendi. Bant sarkmaları değerleri 120-350 meV arasında olduğu hesaplandı. Filmlerin görünür bölgede %45-92 arasında geçirgenlik değerlerine sahip olduğu belirlendi.

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Optical and structural properties of sputtered CdS films for thin film solar cell applications

Cited by 45 publications

References 29 publications

Spin-coated nickel doped cadmium sulfide thin films for third harmonic generation applications

Spin-coated nickel doped cadmium sulfide thin films for third harmonic generation applications

RF/DC Magnetron Sputtering Deposition of Thin Layers for Solar Cell Fabrication

Kimyasal Banyo Depolama Yöntemi ile Elde Edilen CdS Filmlerinin Tavlama Sıcaklığının Kristal, Optiksel ve Yapısal Özellikleri Üzerine Etkisi

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