Optical and Structural characterization of spraying ZrO2 and doped B: ZrO2 thin films

Muhammad, Shawki Khalaf; Dawood, Mohammed O.; Ahmed, Nagham Yassin; Hassan, Ehssan S.; Habubi, Nadir F.; Chiad, Sami Salman

doi:10.1088/1742-6596/1660/1/012057

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2023

2024

Publication Types

Select...

Article3

Other2

Relationship

Self Cite0

Independent5

Authors

Journals

Cited by 8 publications

References 21 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

Physical properties modification of ZnS films by doping Ag via chemical spray pyrolysis

Essa,

Naser,

Dawood

et al. 2023

PHYSICAL MESOMECHANICS OF CONDENSED MATTER: Physical Principles of Multiscale Structure Formation and the Mechanisms of Nonline

View full text Add to dashboard Cite

Physical properties modification of ZnS films by doping Ag via chemical spray pyrolysis

Essa,

Naser,

Dawood

et al. 2023

PHYSICAL MESOMECHANICS OF CONDENSED MATTER: Physical Principles of Multiscale Structure Formation and the Mechanisms of Nonline

View full text Add to dashboard Cite

Synthesis and characterization of fluorine doped ZnO thin films deposited by chemical spray pyrolysis method

Al-Rikabi,

Mohisen,

Naser

et al. 2023

PHYSICAL MESOMECHANICS OF CONDENSED MATTER: Physical Principles of Multiscale Structure Formation and the Mechanisms of Nonline

View full text Add to dashboard Cite

Thickness effects on the physical characterization of nanostructured CuO thin films for hydrogen gas sensor

Hadia,

Jasim,

Chiad

et al. 2024

DJNB

View full text Add to dashboard Cite

In these studies, radio frequency (RF) magnetron sputtering was used to produce nanostructured CuO thin films on glass bases with different thicknesses of (250, 300, and 350 nm). X-ray diffraction (XRD) analysis of these films revealed a polycrystalline structure with a preferred peak along the (111) plane. The Scherrer formula was used to compute the grain size. It was found that the average grain sizes are 10.78 nm, 11.36 nm, and 11.84 nm for film thicknesses of 250, 3000, and 300 nm, respectively, while the dislocation density and strain values decline. The surface roughness decreased from 9.30 nm to 4.71 nm as the thickness increased, according to atomic force microscopy (AFM) data. As the thickness of the film grew, the root mean square (RMS) roughness likewise decreased from 9.18 nm to 4.29 nm. The homogenous, semi-spherical structure comprises uniformly distributed particles, as demonstrated by SEM images. The optical properties of the grown films showed that the absorption coefficient considerably increased with film thickness. Transmittance, band gap, refractive index, and extinction coefficient all decrease with increasing film thickness. The hydrogen gas measurements, indicated a reduction in sensitivity as the thickness and gas concentration increased at 30°C.

show abstract

Optical and Structural characterization of spraying ZrO2 and doped B: ZrO2 thin films

Cited by 8 publications

References 21 publications

Physical properties modification of ZnS films by doping Ag via chemical spray pyrolysis

Physical properties modification of ZnS films by doping Ag via chemical spray pyrolysis

Synthesis and characterization of fluorine doped ZnO thin films deposited by chemical spray pyrolysis method

Thickness effects on the physical characterization of nanostructured CuO thin films for hydrogen gas sensor

Contact Info

Product

Resources

About