GaAs and GaP doped with Mn at wide range of concentrations were studied and compared to literature data of InP and nitrides, GaN and AlN, in aim to understand the mechanism of ferromagnetism observed in some of them. Doping with a moderate Mn concentrations resulted in similar features of electric transport in these compounds, that is p‐type conductivity in host crystal valence band activated with energy related to the ionization energy of Mn acceptor at high temperature and hopping conductance in Mn impurity band dominating at low temperatures. From the magnitude of hopping conductance it was possible to determine Mn configuration, which occurred to be Mn2+(d5) with a bound hole on it, with different localization radius decreasing systematically in a series from GaAs through InP down to GaP and achieving full localization resulting in Mn3+(d4) configuration in wide band gap nitrides, GaN and AlN. A critical concentration of Mn for metal‐insulator transition related to full overlap of Mn‐bound hole wave functions could be calculated as equal to 3.6 × 1020 cm–3 in GaAs, 2.5 × 1021 cm–3 in InP and 3.7 × 1022 cm–3 in GaP, where the latter one corresponds to above 100 at.%. Similarly to GaP, metal‐insulator transition for GaN and AlN doped with Mn cannot be achieved even for 100% of Mn concentration. In GaAs doped with Mn on the level of about 2.8 × 1019 cm–3 split Mn impurity band is formed. Conductivity in the band at this Mn concentration is characterized by high mobility, comparable in magnitude to the mobility in GaAs valence band. Ferromagnetism of GaAs with high Mn concentration (> 1.1 ‐ 1.6 at.%) occurs in samples being on the metallic side of metal‐insulator transition what means that a mediating center in ferromagnetic ordering of Mn centers is totally unlocalized hole. This mechanism is difficult to realize in other studied III‐V compounds because of higher localization of Mn‐bound holes. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)