2013
DOI: 10.1016/j.tsf.2013.03.060
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Optical and electrical properties of V2O5 nanorod films grown using an electron beam

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Cited by 24 publications
(18 citation statements)
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“…21,22 Another PL peak centered at $710 nm (1.74 eV) is attributed to mid-gap states ($1.84 eV) formed by oxygen defects that occurred during growth. 9,10 The nanospheres show an intense UV PL peak centered at $396 nm (3.13 eV), which has not been reported previously. This peak is considered to be due to strong UV absorption resulting from the large amount of V 4+ oxidation states in the nanospheres (Fig.…”
Section: Resultsmentioning
confidence: 45%
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“…21,22 Another PL peak centered at $710 nm (1.74 eV) is attributed to mid-gap states ($1.84 eV) formed by oxygen defects that occurred during growth. 9,10 The nanospheres show an intense UV PL peak centered at $396 nm (3.13 eV), which has not been reported previously. This peak is considered to be due to strong UV absorption resulting from the large amount of V 4+ oxidation states in the nanospheres (Fig.…”
Section: Resultsmentioning
confidence: 45%
“…2(a) shows the XRD pattern of the nanospheres, where there is a diffraction peak corresponding to the (001) plane of a-V 2 O 5 at 20.3 (JCPDS 01-077-2418). [8][9][10] Additional peaks corresponding to the (200), (101), (110), and (301) planes are also observed. This result indicates that the nanosphere has polycrystalline structure.…”
Section: Structure Characterizationmentioning
confidence: 93%
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“…Films of lesser thickness have some minor cracks on the surface that provide direct conduits for gas molecules to ow inside the lm; this may inuence the sensor performance. 35 The WO 3 lm of thickness $85 nm has a smaller grain size and higher surface roughness, as conrmed by the AFM analysis of the lm grain size, as well as the surface roughness data, as shown in Fig. 2.…”
Section: Structural and Morphological Characterizations Of The Wo 3 Lmsmentioning
confidence: 75%
“…For example, Wang et al studied thermal oxidation technique to form V 2 O 5 NRs at low substrate temperatures 18 Kang and co-workers reported the formation of V 2 O 5 NRs by using electron beam irradiation technique. 19 Similarly, RF magnetron sputtering technique has also been used to synthesize V 2 O 5 thin¯lm on silicon substrates. 20 Yan et al 21 fabricated V 2 O 5 NRs based gas sensors on porous silicon (PS) substrates at room temperature by using magnetron sputtering technique.…”
Section: Introductionmentioning
confidence: 99%