2008
DOI: 10.1016/j.apsusc.2008.01.134
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Optical and AFM study of electrostatically assembled films of CdS and ZnS colloid nanoparticles

Abstract: This work presents a cost-effective technology for the formation of nanostructured semiconductor materials for tunable light emitting devices. CdS and ZnS semiconducting colloid nanoparticles coated with organic shell, containing either SO 3 or NH 3 + groups, were deposited as thin films using the technique of electrostatic self-assembly. The films produced were characterized with UV-vis spectroscopy, spectroscopic ellipsometry, and AFM. UV-vis spectra show a substantial blue shift of the main absorption band … Show more

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Cited by 21 publications
(14 citation statements)
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References 27 publications
(23 reference statements)
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“…The radius of semiconductor clusters of about 2 nm, evaluated from the spectral data, corresponds reasonably well to the thickness values obtained from ellipsometry measurements [1]. However the atomic force microscopy (AFM) study of the film morphology reveals the aggregation of electrically charged CdS and ZnS nanoparticles, which can only happen by intercalation with oppositely charged polyelectrolyte layers [1].…”
Section: Introductionmentioning
confidence: 92%
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“…The radius of semiconductor clusters of about 2 nm, evaluated from the spectral data, corresponds reasonably well to the thickness values obtained from ellipsometry measurements [1]. However the atomic force microscopy (AFM) study of the film morphology reveals the aggregation of electrically charged CdS and ZnS nanoparticles, which can only happen by intercalation with oppositely charged polyelectrolyte layers [1].…”
Section: Introductionmentioning
confidence: 92%
“…CdS and ZnS colloid nanoparticles were synthesized as described in [1]. The films of CdS and ZnS nanoparticles were deposited layer-by-layer on solid substrates (glass slides coated with either Chromium-Gold or ITO layers) using intermediate layers of PAH and PSS [20].…”
Section: Sample Preparationmentioning
confidence: 99%
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“…where R p and R s are the complex reflection coefficients for the light polarized parallel (p) and perpendicular (s) to the plane of incidence respectively [50,55,[57][58][59][60][61][62][63][64]. The fundamental equation for the complex reflectance ratio ρ is also described as follows:…”
Section: Spectroscopic Ellipsometry Techniquementioning
confidence: 99%
“…In order to extract useful information about a sample (thicknesses and optical constants of the layers) the experimental data are compared with the data generated using a model which describes the structure of the sample and its optical response [55,57,61].…”
Section: Spectroscopic Ellipsometry Techniquementioning
confidence: 99%