Operational Performances Demonstration of Polymer-Ceramic Embedded Capacitors for MMIC Applications

Bord‐Majek, Isabelle; Kertesz, Philippe; Mazeau, Julie; Caban-Chastas, D.; Lévrier, Bruno; Béchou, Laurent; Ousten, Yves

doi:10.1109/tcpmt.2011.2148122

Cited by 5 publications

(4 citation statements)

References 7 publications

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“…The results are consistent with the measurements shown Fig. 4 that were performed in ref [3] on similar structures. The simulation is thus considered as valid.…”

Section: Finite Element Simulation Of Moisture Absorptionsupporting

confidence: 93%

“…In a previous study, similar capacitors without packages had been aged at 85% Relative Humidity (RH) and 85°C [3] Regardless of the frequency of operation, a capacitance increase during moisture uptake at 85°C, 85%RH is recorded during the first 20 h, an equilibrium is then reached (see Fig. 5).…”

Section: Moisture Effectsmentioning

confidence: 97%

“…High levels of moisture can result in delamination during soldering and rework, or in copper plate corrosion. They may also induce electrical parameter shifts [3,4]. Moreover, due to the CME (Coefficient of Moisture Expansion) of polymers, additional stresses can be induced at the interfaces [5].…”

Section: Introductionmentioning

confidence: 99%

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Qualification procedure for moisture in embedded capacitors

Frémont

Kludt

Wade

et al. 2014

Microelectronics Reliability

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“…The results are consistent with the measurements shown Fig. 4 that were performed in ref [3] on similar structures. The simulation is thus considered as valid.…”

Section: Finite Element Simulation Of Moisture Absorptionsupporting

confidence: 93%

Section: Moisture Effectsmentioning

confidence: 97%

See 1 more Smart Citation

Qualification procedure for moisture in embedded capacitors

Frémont

Kludt

Wade

et al. 2014

Microelectronics Reliability

Self Cite

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“…To analyze stability of electronic components an accelerated ageing process can be used. Treating resistors or capacitors with elevated temperature (and/or humidity) allows (in quite short time) obtain long-term behaviour of tested samples referred to a few years of service [1][2][3][4][5][6][7][8]. Knowing the importance of this issue authors undertook extensive research of reliability of above embedded passives.…”

Section: Introductionmentioning

confidence: 99%

Analysis of long-term stability of capacitors embedded in printed circuit boards

Kłossowicz

Winiarski

Zawierta

et al. 2014

Proceedings of the 2014 37th International Spring Seminar on Electronics Technology

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This paper presents studies of long-term stability of capacitors embedded in printed circuit boards. Planar capacitors fabricated from FaradFlex dielectric foil with copper plates laminated to FR-4 substrate served as test structures. The dielectric was BaTiO 3 ceramic/polymer composition with various fillers and consequently various dielectric constants. Moreover test samples differed in composition thickness and surface size. The investigated capacitors were covered with LDP 2×106 (Laser Drillable Prepreg) protective layers to achieve embedded structures. The behaviour of capacitance as well as dissipation factor was investigated for two values of frequency (1 and 10 kHz) in order to determine their long-term stability. The in-situ accelerated ageing process (capacitance and dissipation factor of test samples performed directly at the ageing conditions) was carried out to perform long-term behaviour analysis. Temperature characteristics both before and after aging process were performed for determination of influence of environmental exposure. Additionally insulation resistance under voltage and temperature stress was monitored and analyzed.

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