2019
DOI: 10.1109/jeds.2019.2947316
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Operation Scheme of Multi-Layer Neural Networks Using NAND Flash Memory as High-Density Synaptic Devices

Abstract: We propose a designing of multi-layer neural networks using 2D NAND flash memory cell as a high-density and reliable synaptic device. Our operation scheme eliminates the waste of NAND flash cells and allows analogue input values. A 3-layer perceptron network with 40,545 synapses is trained on a MNIST database set using an adaptive weight update method for hardware-based multi-layer neural networks. The conductance response of NAND flash cells is measured and it is shown that the unidirectional conductance resp… Show more

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Cited by 30 publications
(16 citation statements)
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“…Read disturb as well as program disturb can change the conductance of a synaptic device, reducing its accuracy. When implementing a synapse array with a NAND-type array, a pass voltage must be applied to de-selected cells of the same string during the inference operation, causing a read disturb ( Figure 10 a) [ 39 , 40 , 41 , 42 , 43 , 44 , 45 , 46 , 47 , 48 , 49 ]. However, in the proposed structure, there is little risk of a read disturb because there is no need to apply pass voltage to the word lines of de-selected cells ( Figure 10 b).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Read disturb as well as program disturb can change the conductance of a synaptic device, reducing its accuracy. When implementing a synapse array with a NAND-type array, a pass voltage must be applied to de-selected cells of the same string during the inference operation, causing a read disturb ( Figure 10 a) [ 39 , 40 , 41 , 42 , 43 , 44 , 45 , 46 , 47 , 48 , 49 ]. However, in the proposed structure, there is little risk of a read disturb because there is no need to apply pass voltage to the word lines of de-selected cells ( Figure 10 b).…”
Section: Resultsmentioning
confidence: 99%
“… ( a ) Schematic of neural networks using NAND flash memory [ 40 ]; ( b ) Schematic of the proposed structure: pass voltage is not used on the de-selected cells and read disturb error can be suppressed. …”
Section: Figurementioning
confidence: 99%
“…5. The estimated device variation (σw/μw) of the W2 and W3 levels are 3.04% and 1.88% respectively, based on the measured data with the assumption of a Gaussian distribution [24], [25]. Fig.…”
Section: Measured Characteristics Of the Nand Cells As Synaptic mentioning
confidence: 99%
“…However, in the weighted sum equation of the DNN model, the weighted sum output is linearly proportional to the input value. Therefore, the amplitude of the input in the DNN model cannot be encoded as an analogue amplitude of the input voltage in the neuromorphic system [24]. We adopt a binary activation of (1, 0) which can be applied to the nonlinear I-V curve by assuming that the input of 1 and 0 correspond to the turn-on (Von) and turn-off voltage (Voff) of the SSL device, respectively.…”
Section: Introductionmentioning
confidence: 99%
“…The estimated device variation (σ w /µ w ) of W2 is 3.43%, and W3 is 1.68% based on the statistical parameters extracted from the measurement data. In this estimation, we assume that the conductance distribution of NAND cells follows a Gaussian distribution (Lee et al, 2019b). Figure 6 represents a PWM circuit consisting of a sawtooth generator, a differential amplifier, and a level shifter.…”
Section: Figure 4 | I Bl -V Wl Characteristics Withmentioning
confidence: 99%