On the Use of Bloom Filters for Defect Maps in Nanocomputing

Wang, Gang; Gong, Wenrui; Kastner, Ryan

doi:10.1109/iccad.2006.320022

Cited by 3 publications

(1 citation statement)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Another important research direction is developing techniques to restore defect mappings during the configuration process. A similar attempt using probabilistic data structure is presented in [Wang et al 2006] with using bloom filters. Last but not least, in terms of area yield current methods are not fully equipped to produce optimum results for the realization of given logic functions.…”

Section: Discussionmentioning

confidence: 99%

A Survey of Fault-Tolerance Algorithms for Reconfigurable Nano-Crossbar Arrays

Tunali

Altun

2017

ACM Comput. Surv.

View full text Add to dashboard Cite

Nano-crossbar arrays have emerged as a promising and viable technology to improve computing performance of electronic circuits beyond the limits of current CMOS. Arrays offer both structural efficiency with reconfiguration and prospective capability of integration with different technologies. However, certain problems need to be addressed and the most important one is the prevailing occurrence of faults. Considering fault rate projections as high as 20% that is much higher than those of CMOS, it is fair to expect sophisticated fault tolerance methods. The focus of this survey paper is the assessment and evaluation of these methods and related algorithms applied in logic mapping and configuration processes. As a start, we concisely explain reconfigurable nano-crossbar arrays with their fault characteristics and models. Following that, we demonstrate configuration techniques of the arrays in the presence of permanent faults and elaborate on two main fault tolerance methodologies, namely defect-unaware and defect-aware approaches, with a short review on advantages and disadvantages. For both methodologies, we present detailed experimental results of related algorithms regarding their strengths and weaknesses with a comprehensive yield, success rate, and runtime analysis. Next, we overview fault tolerance approaches for transient faults. As a conclusion, we overview the proposed algorithms with future directions and upcoming challenges.

show abstract

Section: Discussionmentioning

confidence: 99%

A Survey of Fault-Tolerance Algorithms for Reconfigurable Nano-Crossbar Arrays

Tunali

Altun

2017

ACM Comput. Surv.

View full text Add to dashboard Cite

show abstract

A method to protect Bloom filters from soft errors

Reviriego

Pontarelli

Maestro

et al. 2015

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

View full text Add to dashboard Cite

Bloom filters are used in many computing and networking applications where they provide a simple method to test if an element is present in a set. In some of those systems, reliability is a major concern and therefore the Bloom filters should be protected to ensure that errors do not affect the system behavior. One of the most common type of errors in electronic implementations of Bloom filters are radiation induced soft errors. Soft errors can corrupt the contents of a Bloom filter causing false positives and false negatives. Error Correction Codes (ECCs) can be used to protect the Bloom filter so that for example single bit errors are detected and corrected. However, the use of ECCs impacts the implementation area, power and delay. In this paper, a method to efficiently protect the contents of a Bloom filter is presented. The scheme exploits the different effects at the system level of false positives and false negatives to achieve effective error protection at lower cost than that of a traditional ECC. To illustrate the benefits of the proposed method, a case study is presented where the proposed implementation is compared with the use of a traditional Hamming ECC

show abstract

A Synergetic Use of Bloom Filters for Error Detection and Correction

Reviriego

Pontarelli

Maestro

et al. 2015

IEEE Trans. VLSI Syst.

View full text Add to dashboard Cite

Bloom filters (BFs) provide a fast and efficient way to check whether a given element belongs to a set. The BFs are used in numerous applications, for example, in communications and networking. There is also ongoing research to extend and enhance BFs and to use them in new scenarios. Reliability is becoming a challenge for advanced electronic circuits as the number of errors due to manufacturing variations, radiation, and reduced noise margins increase as technology scales. In this brief, it is shown that BFs can be used to detect and correct errors in their associated data set. This allows a synergetic reuse of existing BFs to also detect and correct errors. This is illustrated through an example of a counting BF used for IP traffic classification. The results show that the proposed scheme can effectively correct single errors in the associated set. The proposed scheme can be of interest in practical designs to effectively mitigate errors with a reduced overhead in terms of circuit area and power

show abstract

On the Use of Bloom Filters for Defect Maps in Nanocomputing

Cited by 3 publications

References 12 publications

A Survey of Fault-Tolerance Algorithms for Reconfigurable Nano-Crossbar Arrays

A Survey of Fault-Tolerance Algorithms for Reconfigurable Nano-Crossbar Arrays

A method to protect Bloom filters from soft errors

A Synergetic Use of Bloom Filters for Error Detection and Correction

Contact Info

Product

Resources

About