On the usage of resonate and fire dynamics in the complex oscillation‐based test approach

Callegari, Sergio; Pareschi, Fabio; Setti, Gianluca; Soma, M.

doi:10.1002/cta.1857

Cited by 3 publications

(3 citation statements)

References 39 publications

(80 reference statements)

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“…In the external tester, the oscillation is achieved by an external feedback loop network which is normally implemented as part of a dedicated tester. The OBT technique has been applied to various kinds of analogue and mixed-signal circuits [6][7][8][9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and faultfree simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.

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Section: Introductionmentioning

confidence: 99%

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Hasan

Yanqing

Sun

2017

Circuits Syst Signal Process

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“…The OBT method is very promising because no external test stimulus is required, and the additional testing circuit can be easily embedded into the circuit under test. The OBT technique has been applied to various kinds of analogue and mixed‐signal circuits . As active analogue filters are widely used building blocks in radio frequency, analogue and mixed‐signal integrated circuits, significant OBT research has been conducted on low‐cost testing of analogue filters .…”

Section: Introductionmentioning

confidence: 99%

Design for testability of high‐order OTA‐C filters

Hasan

Yanqing

Sun

2016

Circuit Theory & Apps

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This is the peer-reviewed version of the following article: Masood-ul Hasan, Yanqing Zhu, and Yichuang Sun, ???Design for testability of high-order OTA-C filters???, International Journal of Circuit Theory and Applications, Vol. 44 (10): 1859-1873, October 2016, which has been published in final form at doi: 10.1002/cta.2200. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Copyright ?? 2016 John Wiley & Sons, Ltd.A study of oscillation-based test for high-order Operational Transconductance Amplifier-C (OTA-C) filters is presented. The method is based on partition of a high-order filter into second-order filter functions. The opening Q-loop and adding positive feedback techniques are developed to convert the second-order filter section into a quadrature oscillator. These techniques are based on an open-loop configuration and an additional positive feedback configuration. Implementation of the two testability design methods for nth-order cascade, IFLF and leapfrog (LF) filters is presented, and the area overhead of the modified circuits is also discussed. The performances of the presented techniques are investigated. Fourth-order cascade, inverse follow-the-leader feedback (IFLF) and LF OTA-C filters were designed and simulated for analysis of fault coverage using the adding positive feedback method based on an analogue multiplexer. Simulation results show that the oscillation-based test method using positive feedback provides high fault coverage of around 97%, 96% and 95% for the cascade, IFLF and LF OTA-C filters, respectively. Copyright ???? 2016 John Wiley & Sons, Ltd

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“…Since the first Lorenz chaotic attractor has been discovered by Lorenz , many scientists and engineers pay more attention to the research of chaotic characteristic in linear or nonlinear system . Because of the aperiodic oscillations showed in chaotic systems, there are many chaotic phenomena in the field of weather forecast.…”

Section: Introductionsmentioning

confidence: 99%

The design and implementation of a multi‐wing chaotic attractor based on a five‐term three‐dimension system

Wang

Tang

Chen

2015

Circuit Theory & Apps

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SUMMARYThe last two decades have seen great progress about the generation and circuit realization of multi-wing chaotic attractor. In this paper, several multi-scroll chaotic attractors are generated from a five-term system by adding a piecewise linear function. Moreover, some basic properties in terms of symmetry and dissipation, equilibrium points, eigenvalues of the Jacobian matrices, Lyapunov exponent spectrum, bifurcation diagram, and Poincaré map are studied. In particular, an analog circuit is designed to implement the proposed multi-scroll attractors, which are different from the traditional attractors. Furthermore, an integrated circuit diagram is designed to realize the fractional-order multi-scroll attractors. Finally, the performed experimental results confirm the theoretical analysis, and our work lends itself to many potential applications in engineering.

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On the usage of resonate and fire dynamics in the complex oscillation‐based test approach

Cited by 3 publications

References 39 publications

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters

Design for testability of high‐order OTA‐C filters

The design and implementation of a multi‐wing chaotic attractor based on a five‐term three‐dimension system

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