On the structure and homogeneity of solid solutions: The limits of conventional X-ray diffraction

Michaelsen, C.

doi:10.1080/01418619508243802

Cited by 119 publications

(93 citation statements)

References 23 publications

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“…2 are consistent with those reported in Ref. 17 for layers with thicknesses of 1-40 nm deposited using a dry process, including the gradual shift of the merged peak toward lower angles. Naturally, this transition is due to the crystal structures of the Co and Cu layers becoming coherent; a layer thickness of 10 nm is sufficiently thick to maintain a multilayer structure.…”

Section: Introductionsupporting

confidence: 81%

“…15,16 Michaelsen carried out an X-ray diffraction (XRD) study of Co/Cu multilayers prepared by triode-magnetron sputtering in an ultra-high vacuum. 17 It was found that as the layer thickness was reduced from 40 nm to 1 nm, the XRD pattern changed from that associated with two separate phases to a single pattern identical to that for a homogenous solid solution; this a Electronic mail: takane-naoto@pref.nagano.lg.jp transition occurred at approximately 10 nm. However, no similar study has been carried out for multilayers produced by electrodeposition, and it is unknown whether a similar transition would take place.…”

Section: Introductionmentioning

confidence: 99%

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Crystal structure of Co/Cu multilayers prepared by pulse potential electrodeposition with precisely controlled ultrathin layer thickness

et al. 2013

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Co/Cu multilayers were electrodeposited in a single electrolyte using the pulse potential method and the layer thickness was precisely controlled in accordance with Faraday's law. X-ray diffraction revealed that multilayers with layer thicknesses in the range of 25–100 nm consisted of fcc-Co and fcc-Cu phases. For layers thinner than 10 nm, the fcc-Co and fcc-Cu phases merged to form a single crystal phase. When the layers were <1 nm, one diffraction peak of the single crystal phase became proportionally higher as the layer became thinner. The surface structure of multilayers also varied with the layer thickness

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Section: Introductionsupporting

confidence: 81%

Section: Introductionmentioning

confidence: 99%

Crystal structure of Co/Cu multilayers prepared by pulse potential electrodeposition with precisely controlled ultrathin layer thickness

et al. 2013

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“…For a multilayered structure with sufficient coherence along the growth direction, the appearance of superlattice satellite reflections can be expected 32 as can clearly be seen for t Co = 2.0 nm and 3.0 nm in Fig. 1a.…”

Section: Results On Multilayers With Cu Layers Depositedmentioning

confidence: 71%

“…The distance of satellites from the main reflection is inversely proportional to the bilayer length = t Co +t Cu . 32,33 The dashed lines indicate a corresponding evolution of the satellite peak positions.…”

Section: Results On Multilayers With Cu Layers Depositedmentioning

confidence: 99%

Giant Magnetoresistance and Structure of Electrodeposited Co/Cu Multilayers: The Influence of Layer Thicknesses and Cu Deposition Potential

Rajasekaran

Mani

Tóth

et al. 2015

J. Electrochem. Soc.

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The giant magnetoresistance (GMR) and structure was investigated for electrodeposited Co/Cu multilayers prepared by a conventional galvanostatic/potentiostatic pulse combination from a pure sulfate electrolyte with various layer thicknesses, total multilayer thickness and Cu deposition potential. X-ray diffraction (XRD) measurements revealed superlattice satellite reflections for many of the multilayers having sufficiently large thickness (at least 2 nm) of both constituent layers. The bilayer repeats derived from the positions of the visible superlattice reflections were typically 10 -20% higher than the nominal values. The observed GMR was found to be dominated by the multilayer-like ferromagnetic (FM) contribution even for multilayers without visible superlattice satellites. There was always also a modest superparamagnetic (SPM) contribution to the GMR and this term was the largest for multilayers with very thin (0.5 nm) magnetic layers containing apparently a small amount of magnetically decoupled SPM regions. No oscillatory GMR behavior with spacer thickness was observed at any magnetic layer thickness. The saturation of the coercivity as measured by the peak position of the MR(H) curves indicated a complete decoupling of magnetic layers for large spacer thicknesses. The GMR increased with total multilayer thickness which could be ascribed to an increasing SPM contribution to the GMR due to an increasing surface roughness, also indicated by the increasing coercivity. For multilayers with Cu layers deposited at more and more positive potentials, the GMR FM term increased and the GMR SPM term decreased. At the same time, a corresponding reduction of surface roughness measured with atomic force microscopy indicated an improvement of the multilayer structural quality which was, however, not accompanied by an increase of the superlattice reflection intensities. The present results underline that whereas the structural quality as characterized by the surface roughness generally correlates fairly well with the magnitude of the GMR, the microstructural features determining the amplitude of superlattice reflections apparently do not have a direct influence on the GMR. Due to the large giant magnetoresistance (GMR) effect observed in physically deposited Co/Cu multilayers, 1-3 a lot of efforts have been devoted to the study of GMR also on electrodeposited (ED) Co/Cu multilayers (for detailed references, see a recent review).4 A variety of baths have been used for the preparation of ED Co/Cu multilayers, 4 the simplest one containing merely CoSO 4 and CuSO 4 . Over the last two decades, numerous reports have been published on studying the GMR characteristics of ED Co/Cu multilayers from the pure sulfate bath (containing at most some buffering agents). [5][6][7][8][9][10][11][12][13][14][15] In this list of references, we have included only those works from the much larger number of reports 4 in which the ED Co/Cu multilayers were prepared from the sulfate bath at or close to the electrochemically optimized Cu depositi...

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“…When the crystallite size of a material is reduced to below a critical length scale, a nanostructured solid solution cannot be unambiguously differentiated from a nanocomposite using conventional XRD [3]. In a nanocomposite where the two phases have close lattice parameters and x-ray structural coherence, the Bragg peak of one phase has some degree of overlap with that of the other phase.…”

Section: Introductionmentioning

confidence: 99%

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

Chow

2002

MRS Proc.

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The properties of nanostructured films can be tailored by many factors such as composition, structure, preferred orientation, microstructure, interphase interface and grain boundaries. Compositional control of magnetic properties of recording media depends on the miscibility of constituent elements. However, for nanostructured materials with a large surfaceto-volume ratio of atoms, the miscibility at the nanoscale may not necessarily follow the prediction of conventional phase diagram that does not consider the effects of surface and interface. This limitation further complicates the prediction of phase separation at grain boundaries and interphase interface. Using anomalous x-ray scattering, the alloying and composition of a specific long range order of textured nanostructured films has been investigated. Such information may not be readily available from conventional characterization techniques.

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On the structure and homogeneity of solid solutions: The limits of conventional X-ray diffraction

Cited by 119 publications

References 23 publications

Crystal structure of Co/Cu multilayers prepared by pulse potential electrodeposition with precisely controlled ultrathin layer thickness

Crystal structure of Co/Cu multilayers prepared by pulse potential electrodeposition with precisely controlled ultrathin layer thickness

Giant Magnetoresistance and Structure of Electrodeposited Co/Cu Multilayers: The Influence of Layer Thicknesses and Cu Deposition Potential

Anomalous X-ray Scattering for Determination of Nanostructured Alloy Formation and Site-specific Chemistry of Bragg Peak

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