On the Reliability of Power Silicon Rectifier Diodes above the Maximum Permissible Operation Junction Temperature

Obreja, V.V.N.

doi:10.1109/isie.2006.295743

Cited by 6 publications

(2 citation statements)

References 12 publications

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“…With operating voltage and temperature above the rating parameters, leakage current increases dramatically and the diodes fail into short circuit at the chip's peripheral surface [14,15]. Experiments show that the diodes operation temperature can be increased without risks of failure by improving the junction edge current control, like a junction passivation process [16,17]. A further research reveals the mechanism is junction carrier avalanche multiplication, and the weak spots are near the chips' edge [18].…”

Section: Rising Of Leakage Currentmentioning

confidence: 99%

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Blaabjerg

Wang

et al. 2013

Microelectronics Reliability

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Emerging applications (e.g. electric vehicles, renewable energy systems, more electric aircrafts, etc.) have brought more stringent reliability constrains into power electronic products because of safety requirements and maintenance cost issues. To improve the reliability of power electronics, better understanding of failure modes and failure mechanisms of reliability-critical components in power electronic circuits are needed. Many efforts have been devoted to the reduction of IGBT failures, while the study on the failures of freewheeling diodes is less impressive. It is of importance to investigate the catastrophic failures of freewheeling diodes as they could induce the malfunction of other components and eventually the whole power electronic circuits. This paper presents an overview of those catastrophic failures and gives examples of the corresponding consequences to the circuits.

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Section: Rising Of Leakage Currentmentioning

confidence: 99%

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Blaabjerg

Wang

et al. 2013

Microelectronics Reliability

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“…It has been observed that a reduction in the operation temperature of a device can correspond to an exponential increase in the reliability and life expectancy of the device [1,2]. Among the designs for cooling application in electronic industry, natural convection in air has the economics, simplicity, and unmatched reliability, and continues to underscore the desire to cool systems and components.…”

Section: Introductionmentioning

confidence: 99%

Thermal conductivity of epoxy/surface functionalized carbon nano materials

Qin

Wang

Moon

et al. 2009

2009 59th Electronic Components and Technology Conference

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Multiwalled carbon nanotubes (MWCNTs) and graphite nanoplates were functionalized by chemical methods. The functionalized chemical structures were characterized by Fourier-Transform Infrared (FTIR). It is found that carboxyl groups were grafted onto MWCNTs and graphite nanoplates surfaces. Epoxy and cyanate ester polymer composites with functionalized MWCNTs and graphite nanoplates were prepared, and their thermal conductivities were measured by the a Netzsch Nano Flash, which showed that the thermal conductivity of the polymer composites can be significantly improved by building chemical bondings between polymer matrix and carbon nano fillers.

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Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic

Obreja

Codreanu

Poenar

et al. 2011

Microelectronics Reliability

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On the Reliability of Power Silicon Rectifier Diodes above the Maximum Permissible Operation Junction Temperature

Cited by 6 publications

References 12 publications

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Overview of catastrophic failures of freewheeling diodes in power electronic circuits

Thermal conductivity of epoxy/surface functionalized carbon nano materials

Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic

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