1976
DOI: 10.1107/s0567739476000442
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On the nature of grown-in defects in topaz

Abstract: A study has been made of crystals of topaz by optical and interference microscopy, X-ray topography, and scanning and transmission electron microscopy. Most of the samples show a nearly perfect region with dislocation density ~ 102 cm -2 surrounded by a highly defective narrow rim containing dislocations (density ~ 107 cm -2 and higher), low-angle boundaries, networks and planar faults. The Burgers vectors of the dislocations observed in both regions of the crystal have been determined by means of diffraction … Show more

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