On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment

Plancher, Emeric; Petit, Johann; Maurice, Claire; Favier, Véronique; Saintoyant, Lucie; Loisnard, Dominique; Rupin, N.; Marijon, Jean Baptiste; Ulrich, Olivier; Bornert, Michel; Micha, Jean Sébastien; Robach, Odile; Castelnau, Olivier

doi:10.1007/s11340-015-0114-1

Cited by 34 publications

(44 citation statements)

References 25 publications

(38 reference statements)

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“…[5], including increasing the exposure time, selecting full resolution (i.e., no pixel binning) or using software integration instead of hardware integration, using high digitization depth to record gray levels, and placing the detector close to the sample. Different physical quantities have been assessed by HR-EBSD with high accuracy, ranging from elastic strain and stress [6], geometrically necessary dislocations [13], local misorientations [14] and slip activities [15]. These measurements via HR-EBSD also enrich numerical simulations.…”

Section: Introductionmentioning

confidence: 99%

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Estimation of elastic strain by integrated image correlation on electron diffraction patterns

et al. 2019

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High-angular-resolution electron backscattered diffraction (HR-EBSD) has been developed to study local elastic strains in crystals. An integrated Digital Image Correlation (DIC) procedure for high resolution diffraction patterns, as recently proposed to bypass several problems of the conventional cross-correlation-based algorithm, was implemented. Through two examples of experimental data where the algorithm was used and compared to conventional means, the current paper illustrates the benefits of the integrated DIC method. It is found that both measurement uncertainty and computation time were simultaneously reduced. Moreover, an enhanced robustness was obtained for relatively high misorientations relative to methods based on cross-correlation. Different computing conditions are explored on experimental data. A number of practical usage conditions are proposed to achieve better precision and speed.

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Section: Introductionmentioning

confidence: 99%

“…These measurements via HR-EBSD also enrich numerical simulations. For example, the elastic strains measured by HR-EBSD have been successfully compared to crystal plasticity finite element simulation for single crystal [15] and polycrystals [16] samples.…”

Section: Introductionmentioning

confidence: 99%

Estimation of elastic strain by integrated image correlation on electron diffraction patterns

et al. 2019

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“…The final degree of freedom relates to the hydrostatic strain, which cannot be measured directly but can be determined by constraining the surface normal stress to zero (Wilkinson et al, 2006b). Subsequent methodological refinements have focused on assessing and improving the accuracy and precision of strain measurement and extending the potential applications to more challenging microstructures (Britton, Maurice, et al, 2010;, 2012bBritton et al, 2013aBritton et al, , 2013bMaurice & Fortunier, 2008;Maurice et al, 2012;Plancher et al, 2015;Tong et al, 2015;Villert et al, 2009;Wilkinson et al, 2014). A recent advance that is particularly important for analysis of geological materials, which are commonly deformed to large plastic strains, has been the development of routines for mapping elastic strains in the presence of lattice rotations of several degrees, such as subgrain boundaries , 2012bMaurice et al, 2012).…”

Section: Technique Developmentmentioning

confidence: 99%

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals

Wallis¹,

Hansen²,

Britton³

et al. 2019

Preprint

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Analysis of distortions of the crystal lattice within individual mineral grains is central to the investigation of microscale processes that control and record tectonic events. These distortions are generally combinations of lattice rotations and elastic strains, but a lack of suitable observational techniques has prevented these components being mapped simultaneously and routinely in earth science laboratories. However, the technique of high-angular resolution electron backscatter diffraction (HR-EBSD) provides the opportunity to simultaneously map lattice rotations and elastic strains with exceptional precision, on the order of 0.01° for rotations and 10^-4 in strain, using a scanning electron microscope. Importantly, these rotations and lattice strains relate to densities of geometrically necessary dislocations and residual stresses. Recent works have begun to apply and adapt HR-EBSD to geological minerals, highlighting the potential of the technique to provide new insights into the microphysics of rock deformation. Therefore, the purpose of this overview is to provide a summary of the technique, to identify caveats and targets for further development, and to suggest areas where it offers potential for major advances. In particular, HR-EBSD is well suited to characterising the roles of different dislocation types during crystal plastic deformation and to mapping heterogeneous internal stress fields associated with specific deformation mechanisms/microstructures or changes in temperature, confining pressure, or applied deviatoric stress. These capabilities make HR-EBSD a particularly powerful new technique for analysing the microstructures of deformed geological materials.

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“…Reflection positions in Laue diffraction, for instance, can only be obtained within a certain level of accuracy limited by the spatial distortion of the detector inherent from its manufacturing process, and by how precisely the shape of the reflection is known. Elastic strains can currently be estimated to within 10 −4 [56] but this can be pushed down to around 5 × 10 −5 by careful error analysis [57]. The digital image correlation (DIC) technique can also be used to estimate the distortion of the Laue pattern and improve strain resolution to about 10 −5 [58].…”

Section: Elastic Strainsmentioning

confidence: 99%

Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Zhou

Kou

et al. 2018

QuBS

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Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.

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On the Accuracy of Elastic Strain Field Measurements by Laue Microdiffraction and High-Resolution EBSD: a Cross-Validation Experiment

Cited by 34 publications

References 25 publications

Estimation of elastic strain by integrated image correlation on electron diffraction patterns

Estimation of elastic strain by integrated image correlation on electron diffraction patterns

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals

Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

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