Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Abstract

Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.

Multi-scale microstructural investigation of a laser 3D printed Ni-based superalloy

“…It should be noted that the value of the extent of orientation variance between cellular colonies is barely accessible by conventional EBSD method [2] due to its poor angular resolution (~0.5). Therefore, synchrotron μXRD technique with superior orientation resolution (< 0.01) was employed [22].…”

Combining Laue diffraction with Bragg coherent diffraction imaging at 34-ID-C

“…However, strategies for identifying Laue patterns from multiple grains within the beam are being developed. Future potentially beneficial developments could include integrating machine learning algorithms to assist indexing of complex Laue patterns (Zhou et al, 2018) or 3D reconstructions based on variable-wavelength coherent X-rays rather than on rocking crystals (Cha et al, 2016b;Lauraux et al, 2020). These developments could improve standardization of each experiment, minimize the man-hours spent finding signals for experiments, and facilitate faster analysis and interpretation of numerous datasets.…”

Review on residual stress in selective laser melting additive manufacturing of alloy parts

“…In addition to providing calibration and validation for the computational model, a more practical goal of residual stress testing is to integrate itself into the SLM process control system. With the improvement of computing efficiency, synchrotron radiation-based scanning Laue X-ray micro-diffraction has been developed into a near real-time quantitative imaging technique at the micro and Nano-scale, which may bring new prospects to the control over residual stress [131]. Micro-CT [126], digital image correlation [83] and displacement sensors [104] accompanied with optical [140] and acoustic [141] methods have achieved many meaningful achievements, and further stimulate the detection and analysis of residual stresses.…”