2020
DOI: 10.1007/s10854-019-02814-8
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On high-field conduction and I–V measurements in quaternary Se–Te–In–Pb nano-chalcogenide thin films

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Cited by 8 publications
(11 citation statements)
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“…wt.%) alloys have been plotted in Figure 1 and for x = 4 and 6 at. wt.% of Pb is shown in our other research papers [2,41]. Diffraction peaks and observed d spacing of investigated alloys match closely with those of the standard JCPDS card no.…”
Section: Methodssupporting
confidence: 84%
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“…wt.%) alloys have been plotted in Figure 1 and for x = 4 and 6 at. wt.% of Pb is shown in our other research papers [2,41]. Diffraction peaks and observed d spacing of investigated alloys match closely with those of the standard JCPDS card no.…”
Section: Methodssupporting
confidence: 84%
“…researchers[6, 17, 41, 46 and 78]. All these observation shows clearly an agreement with the deduced results on variation in band gap, density of defected states[41] as well as average crystalline size from XRD results with Pb content listed in Tables1, 4, and 5, respectively.The obtained results on E g opt are in good agreement with the deduced value of activation energy (ΔE σ ) for nanochalcogenide Se 79-x Te 15 In 6 Pb x (x = 0, 1, 2, 4, 6, 8, and 10 at. wt.%) systems in our previous results[41].…”
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confidence: 88%
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