On Component Reliability and System Reliability for Space Missions

Abstract

Abstract-This paper is to address the basics, the limitations and the relationship between component reliability and system reliability through a study of flight computing architectures and related avionics components for NASA future missions. Component reliability analysis and system reliability analysis need to be evaluated at the same time, and the limitations of each analysis and the relationship between the two analyses need to be understood.

Impact of overshoot current on set operation of atom switch

“…When the transition time becomes shorter, the transient current increases. 22) When the transition time is shorter than 1 ns, the amplitude is much larger than I C . On the other hand, with increasing I C , the overshoot becomes smaller.…”

“…The transient current is calculated using the Simulation Program with Integrated Circuit Emphasis (SPICE) model with our circuit parameters. 22) We assume that the resistance of the atom switch linearly changes within the transition time (t TRAN ). The overshoot current is obtained during the resistive transition.…”

“…The impact of the transient current on the resistive switching behavior during the set process has also been investigated. [17][18][19][20][21][22] Kinoshita et al 17) and Song et al 19) demonstrated that the large transient current exceeds the control current, resulting in a low resistive state and a reset current larger than the control current. A resistor 18,20) or a transistor 17) serially connected to a switch has a beneficial effect on the transient current.…”

A Method for Function Integrity Diagnosis and Documentation: Fidd

“…However, this strategy of quality assurance is expensive and places excessive importance on the final stages of development, which are then typically dominated by lengthy and iterative testing and adjusting of every single component (Wertz and Larson, 1999). An alternative strategy has come up in the aerospace sector: in an effort to increase competitiveness through reduction of development and manufacturing costs, designers have started rethinking their conception of system reliability and robustness (Chen et al, 2012;Gluchshenko, 2012). While the current approach underlying the use of space grade components is to ensure robust designs by minimizing the absolute likelihood of failure (i.e.…”