2006 International Interconnect Technology Conference 2006
DOI: 10.1109/iitc.2006.1648640
|View full text |Cite
|
Sign up to set email alerts
|

On-Chip Copper-Based vs. Optical Interconnects: Delay Uncertainty, Latency, Power, and Bandwidth Density Comparative Predictions

Abstract: Abstract-As CMOS technology is scaled, it has become increasingly difficult for conventional copper interconnect to satisfy different design requirements. On-chip optical interconnect has been considered as a potential substitute for electrical interconnect. In this paper, predictions of the performance of CMOS compatible optical devices are made based on current state-ofart optical technologies. Based on these predictions, electrical and optical interconnects are compared for delay uncertainty, latency, power… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2008
2008
2021
2021

Publication Types

Select...
3
1
1

Relationship

0
5

Authors

Journals

citations
Cited by 28 publications
references
References 8 publications
(11 reference statements)
0
0
0
Order By: Relevance